{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T09:30:31Z","timestamp":1776159031544,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51674136"],"award-info":[{"award-number":["51674136"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100009015","name":"Innovation Research Fund for Production Technology Issues of Liaoning Technical University","doi-asserted-by":"publisher","award":["20160019T"],"award-info":[{"award-number":["20160019T"]}],"id":[{"id":"10.13039\/501100009015","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3354177","type":"journal-article","created":{"date-parts":[[2024,1,15]],"date-time":"2024-01-15T21:21:58Z","timestamp":1705353718000},"page":"15410-15418","source":"Crossref","is-referenced-by-count":10,"title":["Low-Voltage Arc Fault Identification Using a Hybrid Method Based on Improved Salp Swarm Algorithm\u2013Variational Mode Decomposition\u2013 Random Forest"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7885-7280","authenticated-orcid":false,"given":"Bin","family":"Li","sequence":"first","affiliation":[{"name":"School of Electrical and Control Engineering, Liaoning Technical University, Huludao, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-5535-1182","authenticated-orcid":false,"given":"Jinglong","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Electrical and Control Engineering, Liaoning Technical University, Huludao, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3170288"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2890892"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.815098"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2266440"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3115512"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2963500"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2017.2742143"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3389\/fenrg.2021.824414"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCNEA53019.2021.00062"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2960512"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3165793"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2627248"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2273292"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3077871"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3164246"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2021.3098376"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2020.2969966"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3242067"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2288675"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3221623"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/en14144137"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/2260\/1\/012027"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3027002"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3051669"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2019.2942630"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3041737"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3165260"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3080376"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3044787"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3322486"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2019.8885020"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3228551"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/e25081128"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2936254"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/AEECA49918.2020.9213634"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.04.059"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2915533"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3014916"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3021918"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3228421"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10380310\/10399639.pdf?arnumber=10399639","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,2]],"date-time":"2024-02-02T00:39:58Z","timestamp":1706834398000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10399639\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3354177","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}