{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,10]],"date-time":"2026-01-10T19:26:33Z","timestamp":1768073193496,"version":"3.49.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11974210"],"award-info":[{"award-number":["11974210"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3354773","type":"journal-article","created":{"date-parts":[[2024,1,16]],"date-time":"2024-01-16T18:24:24Z","timestamp":1705429464000},"page":"16989-16998","source":"Crossref","is-referenced-by-count":4,"title":["Modeling of the Gate Bias-Dependent Velocity\u2013Field Relationship and Physics-Based Current-Voltage Characteristics in AlGaN\/GaN HFETs"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1305-226X","authenticated-orcid":false,"given":"Mingyan","family":"Wang","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, Shandong University, Jinan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9207-8344","authenticated-orcid":false,"given":"Yuanjie","family":"Lv","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Application Specific Integrated Circuit, Hebei Semiconductor Research Institute, Shijiazhuang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8790-5870","authenticated-orcid":false,"given":"Heng","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Shandong University, Jinan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7120-1294","authenticated-orcid":false,"given":"Peng","family":"Cui","sequence":"additional","affiliation":[{"name":"Institute of Novel Semiconductors, Shandong University, Jinan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6590-9627","authenticated-orcid":false,"given":"Zhaojun","family":"Lin","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Shandong University, Jinan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/led.2015.2388706"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2007.911076"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2009.2030722"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2973081"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.3358392"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.894614"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.1448889"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3078717"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/mop.1102"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2265320"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.916677"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.885099"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.367269"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.365963"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.4891258"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2654262"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2022.3217127"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.4983761"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.870571"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2005.03.006"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2532919"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.5005518"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2819178"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3159283"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2009.09.026"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10380310\/10401224.pdf?arnumber=10401224","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,26]],"date-time":"2024-11-26T22:50:21Z","timestamp":1732661421000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10401224\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3354773","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}