{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T16:17:36Z","timestamp":1771517856419,"version":"3.50.1"},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"Physical Metrology for National Strategic Needs"},{"DOI":"10.13039\/501100003706","name":"Korea Research Institute of Standards and Science","doi-asserted-by":"publisher","award":["KRISS-2023-GP2023-0002"],"award-info":[{"award-number":["KRISS-2023-GP2023-0002"]}],"id":[{"id":"10.13039\/501100003706","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3355496","type":"journal-article","created":{"date-parts":[[2024,1,18]],"date-time":"2024-01-18T18:34:01Z","timestamp":1705602841000},"page":"12902-12908","source":"Crossref","is-referenced-by-count":4,"title":["Design of a Waveguide Calibration Kit Consisting of Offset Shorts for Low Measurement Uncertainty"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2506-576X","authenticated-orcid":false,"given":"Chihyun","family":"Cho","sequence":"first","affiliation":[{"name":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0572-1005","authenticated-orcid":false,"given":"Jae-Yong","family":"Kwon","sequence":"additional","affiliation":[{"name":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7457-6585","authenticated-orcid":false,"given":"Tae-Weon","family":"Kang","sequence":"additional","affiliation":[{"name":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8337-1821","authenticated-orcid":false,"given":"Hyunji","family":"Koo","sequence":"additional","affiliation":[{"name":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1541-0745","authenticated-orcid":false,"given":"Woohyun","family":"Chung","sequence":"additional","affiliation":[{"name":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ojcoms.2020.3010270"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.3010896"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2013.2240953"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tthz.2015.2502068"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/abd371"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3291794"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tthz.2011.2127370"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/cpem.2014.6898404"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tmtt.2015.2396496"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.TN.2109"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/arftg57476.2023.10278873"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3208645"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3141310"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10380310\/10403884.pdf?arnumber=10403884","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T10:57:31Z","timestamp":1706785051000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10403884\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3355496","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}