{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:22:36Z","timestamp":1740169356770,"version":"3.37.3"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3356559","type":"journal-article","created":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T18:43:52Z","timestamp":1705949032000},"page":"15535-15548","source":"Crossref","is-referenced-by-count":0,"title":["Open-Circuit Fault-Tolerant Method for Half-Bridge Switches of Three-Level Quasi-Switched Boost T-Type Inverter to Improve Voltage Gain"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4096-5208","authenticated-orcid":false,"given":"Duc-Tri","family":"Do","sequence":"first","affiliation":[{"name":"Faculty of Electrical and Electronics Engineering, Ho Chi Minh City University of Technology and Education, Ho Chi Minh City, Vietnam"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1774-0817","authenticated-orcid":false,"given":"Khai M.","family":"Nguyen","sequence":"additional","affiliation":[{"name":"Faculty of Electrical and Electronics Engineering, Ho Chi Minh City University of Technology and Education, Ho Chi Minh City, Vietnam"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7135-5077","authenticated-orcid":false,"given":"Vinh-Thanh","family":"Tran","sequence":"additional","affiliation":[{"name":"Faculty of Electrical and Electronics Engineering, Ho Chi Minh City University of Technology and Education, Ho Chi Minh City, Vietnam"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3147061"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3000818"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.808920"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3073621"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3183276"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2774722"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2424201"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3166805"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2020.2984159"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2795564"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3071011"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3114711"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2847709"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2967733"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2514979"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2017.0085"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2922687"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE50734.2022.9948168"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2972592"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2834367"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2779472"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2017.7931187"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10380310\/10410635.pdf?arnumber=10410635","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,2]],"date-time":"2024-02-02T00:31:20Z","timestamp":1706833880000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10410635\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3356559","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2024]]}}}