{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,2]],"date-time":"2026-04-02T16:02:17Z","timestamp":1775145737750,"version":"3.50.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science","doi-asserted-by":"publisher","award":["JP22K05243"],"award-info":[{"award-number":["JP22K05243"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science","doi-asserted-by":"publisher","award":["JP23H01405"],"award-info":[{"award-number":["JP23H01405"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3375332","type":"journal-article","created":{"date-parts":[[2024,3,11]],"date-time":"2024-03-11T18:13:55Z","timestamp":1710180835000},"page":"39152-39165","source":"Crossref","is-referenced-by-count":4,"title":["Circuit Models of Q(t) Data and Analyses of Saturation Time Dependency on Delay Parameters"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7151-2933","authenticated-orcid":false,"given":"Ryota","family":"Kitani","sequence":"first","affiliation":[{"name":"Osaka Research Institute of Industrial Science and Technology, Izumi, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5431-457X","authenticated-orcid":false,"given":"Shinya","family":"Iwata","sequence":"additional","affiliation":[{"name":"Osaka Research Institute of Industrial Science and Technology, Izumi, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-0283-8304","authenticated-orcid":false,"given":"Tomoka","family":"Tsuya","sequence":"additional","affiliation":[{"name":"Osaka Research Institute of Industrial Science and Technology, Izumi, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3199-1789","authenticated-orcid":false,"given":"Hiroaki","family":"Uehara","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Kanto Gakuin University, Kanazawa-ku, Yokohama, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3599-7878","authenticated-orcid":false,"given":"Tatsuki","family":"Okamoto","sequence":"additional","affiliation":[{"name":"Institute of Science and Technology, Kanto Gakuin University, Kanazawa-ku, Yokohama, Japan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3629-5966","authenticated-orcid":false,"given":"Tatsuo","family":"Takada","sequence":"additional","affiliation":[{"name":"Tokyo City University, Setagaya-ku, Tokyo, Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/eej.4390920605"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2017.006355"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/iseim.2017.8088692"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/iwipp.2019.8799087"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/cmd.2018.8535946"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2018.006738"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/icd53806.2022.9863575"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/iseim.2017.8088751"},{"key":"ref9","first-page":"177","article-title":"Study on characteristics of electrical tree in epoxy resin measured by current integrated charge method","volume-title":"Proc. Int. Symp. Electr. Insulating Mater. (ISEIM)","author":"Fuiji"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/eic43217.2019.9046562"},{"key":"ref11","first-page":"169","article-title":"Q(t)-measurements of electrically deteriorated polymeric materials under environmental testing","volume-title":"Proc. Int. Symp. Electr. Insulating Mater. (ISEIM)","author":"Kitani"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/iseim.2017.8166563"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3055288"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2023.3332312"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/ISEIM60444.2023.10329035"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/ISEIM60444.2023.10329179"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.5324\/nordis.v0i26.3267"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/en14020478"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-19-6156-4"},{"key":"ref20","volume-title":"(Python 3.8.9)","year":"2023"},{"key":"ref21","volume-title":"(Numpy 1.24.4)","year":"2023"},{"key":"ref22","volume-title":"(Pandas 2.0.2)","year":"2023"},{"key":"ref23","volume-title":"(Scipy 1.10.1)","year":"2023"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10380310\/10464308.pdf?arnumber=10464308","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,12]],"date-time":"2024-04-12T05:33:11Z","timestamp":1712899991000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10464308\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3375332","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}