{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T22:43:12Z","timestamp":1769553792817,"version":"3.49.0"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3382211","type":"journal-article","created":{"date-parts":[[2024,3,27]],"date-time":"2024-03-27T19:28:54Z","timestamp":1711567734000},"page":"45865-45878","source":"Crossref","is-referenced-by-count":5,"title":["Investigation of Open Circuit DC Winding Induced Voltage Reduction Techniques in Five Phase Non-Overlapped Wound Field Flux Switching Machines"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0545-1890","authenticated-orcid":false,"given":"Muhammad","family":"Yousuf","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, COMSATS University Islamabad, Abbottabad Campus, Abbottabad, Pakistan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5031-6121","authenticated-orcid":false,"given":"Faisal","family":"Khan","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, COMSATS University Islamabad, Abbottabad Campus, Abbottabad, Pakistan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0306-0837","authenticated-orcid":false,"given":"Ahmed","family":"Tameemi","sequence":"additional","affiliation":[{"name":"Ministry of Higher Education and Scientific Research, Baghdad, Iraq"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9585-708X","authenticated-orcid":false,"given":"Wasiq","family":"Ullah","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, COMSATS University Islamabad, Abbottabad Campus, Abbottabad, Pakistan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7769-6956","authenticated-orcid":false,"given":"Siddique","family":"Akbar","sequence":"additional","affiliation":[{"name":"Institute for Drive Systems and Power Electronics, Leibniz University Hannover, Hanover, Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2006.892482"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2276092"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3095615"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2311511"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/en17020538"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2017.0284"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2105874"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VPPC.2010.5728984"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2397173"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2512521"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2829679"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.asej.2022.101791"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2355177"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICElMach.2012.6350039"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2442211"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2157293"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2072972"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/PEOCO.2014.6814433"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2423280"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.918488"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2031901"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2244201"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2698604"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICELMACH.2018.8507026"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2014.7013518"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2608324"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2323089"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/en14217335"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2447733"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2448211"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2402201"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2590988"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2009.0117"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa:20060342"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838106"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2912779"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2846567"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/EVER.2019.8813582"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2987897"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3035258"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.23919\/CJEE.2021.000022"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3094482"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3100807"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2938161"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2682792"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2032633"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3143777"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2096409"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2009.0176"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2008.918612"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2009.0205"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10380310\/10479200.pdf?arnumber=10479200","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,3]],"date-time":"2024-04-03T17:54:28Z","timestamp":1712166868000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10479200\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":51,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3382211","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}