{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:22:39Z","timestamp":1740169359008,"version":"3.37.3"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"University Natural Sciences Research Project of Anhui Province","award":["2022AH051794","2022AH051793","2023AH052169"],"award-info":[{"award-number":["2022AH051794","2022AH051793","2023AH052169"]}]},{"name":"Anhui Provincial New Era Education Quality Project","award":["2022xxsfkc049","2022tsxwd048"],"award-info":[{"award-number":["2022xxsfkc049","2022tsxwd048"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3392638","type":"journal-article","created":{"date-parts":[[2024,4,23]],"date-time":"2024-04-23T19:38:22Z","timestamp":1713901102000},"page":"60070-60080","source":"Crossref","is-referenced-by-count":2,"title":["Power Adapter Appearance Defect Detection Based on Task Feature Decoupling YOLOv8n"],"prefix":"10.1109","volume":"12","author":[{"given":"Jie","family":"Chen","sequence":"first","affiliation":[{"name":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, Anhui, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2680-4050","authenticated-orcid":false,"given":"Yu","family":"Xie","sequence":"additional","affiliation":[{"name":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, Anhui, China"}]},{"given":"Zhengwei","family":"Qian","sequence":"additional","affiliation":[{"name":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, Anhui, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2610-4062","authenticated-orcid":false,"given":"Keqiong","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, Anhui, China"}]},{"given":"Maofa","family":"Zhen","sequence":"additional","affiliation":[{"name":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, Anhui, China"}]},{"given":"Xueyou","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, Anhui, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/i2mtc.2019.8826839"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/fendt47723.2019.8962808"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3116131"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2005.177"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1023\/b:visi.0000029664.99615.94"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/bf00994018"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3245093"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/igarss52108.2023.10282550"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/mwscas.2018.8624022"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-020-09242-5"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-022-12370-9"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2021.108213"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/itca52113.2020.00049"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2016.91"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-023-01401-9"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/icmsp58539.2023.10170867"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10586-023-04156-x"},{"key":"ref19","article-title":"Task-specific context decoupling for object detection","author":"Zhuang","year":"2023","journal-title":"arXiv:2303.01047"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-023-11963-4"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr42600.2020.01079"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/electronics11244211"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3389\/fnbot.2022.1042780"},{"key":"ref24","article-title":"Real-time flying object detection with YOLOv8","author":"Reis","year":"2023","journal-title":"arXiv:2305.09972"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr52729.2023.00721"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr46437.2021.01283"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2018.00913"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/iccv.2017.74"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3292881"},{"key":"ref30","article-title":"DETRs beat YOLOs on real-time object detection","author":"Zhao","year":"2023","journal-title":"arXiv:2304.08069"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3165838"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP49357.2023.10096516"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/itaic58329.2023.10408800"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.icte.2024.02.007"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/tcyb.2021.3095305"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/vtc2022-fall57202.2022.10012809"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2205.12740"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3390\/s22166186"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/app13158583"},{"key":"ref41","article-title":"Inner-IoU: More effective intersection over union loss with auxiliary bounding box","author":"Zhang","year":"2023","journal-title":"arXiv:2311.02877"},{"key":"ref42","article-title":"YOLOX: Exceeding YOLO series in 2021","author":"Ge","year":"2021","journal-title":"arXiv:2107.08430"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10380310\/10506925.pdf?arnumber=10506925","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,3]],"date-time":"2024-05-03T19:03:19Z","timestamp":1714762999000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10506925\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3392638","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2024]]}}}