{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T17:02:23Z","timestamp":1774630943792,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100002553","name":"Seoul National University of Science and Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002553","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3407766","type":"journal-article","created":{"date-parts":[[2024,5,31]],"date-time":"2024-05-31T17:38:39Z","timestamp":1717177119000},"page":"77475-77485","source":"Crossref","is-referenced-by-count":7,"title":["Optimizing Detection: Compact MobileNet Models for Precise Hall Sensor Fault Identification in BLDC Motor Drives"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-8754-0306","authenticated-orcid":false,"given":"Seul","family":"Ki Hong","sequence":"first","affiliation":[{"name":"Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0789-8354","authenticated-orcid":false,"given":"Yongkeun","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2038335"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301754"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2300059"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2254499"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2262391"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2688478"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2844956"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3175011"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2810506"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/su151310430"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2868828"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10111268"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2459072"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2506139"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3081436"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3109869"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3265326"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JESTIE.2022.3196818"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3084921"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2019.8922116"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2917559"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2934794"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2911299"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3093363"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3223338"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2847800"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/s23094330"},{"key":"ref28","article-title":"MobileNets: Efficient convolutional neural networks for mobile vision applications","author":"Howard","year":"2017","journal-title":"arXiv:1704.04861"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00474"},{"key":"ref30","article-title":"Very deep convolutional networks for large-scale image recognition","author":"Simonyan","year":"2014","journal-title":"arXiv:1409.1556"},{"key":"ref31","article-title":"Densely connected convolutional networks","author":"Huang","year":"2016","journal-title":"arXiv:1608.06993"},{"key":"ref32","article-title":"Deep residual learning for image recognition","author":"He","year":"2015","journal-title":"arXiv:1512.03385"},{"key":"ref33","article-title":"Xception: Deep learning with depthwise separable convolutions","author":"Chollet","year":"2016","journal-title":"arXiv:1610.02357"},{"key":"ref34","article-title":"Rethinking the inception architecture for computer vision","author":"Szegedy","year":"2015","journal-title":"arXiv:1512.00567"},{"key":"ref35","article-title":"EfficientNet: Rethinking model scaling for convolutional neural networks","author":"Tan","year":"2019","journal-title":"arXiv:1905.11946"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781107298019"},{"key":"ref37","article-title":"Improving generalization performance by switching from Adam to SGD","author":"Keskar","year":"2017","journal-title":"arXiv:1712.07628"},{"key":"ref38","first-page":"1097","article-title":"ImageNet classification with deep convolutional neural networks","volume-title":"Proc. Adv. Neural Inf. Process. Syst. (NIPS)","author":"Krizhevsky"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2020.3004555"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10542733.pdf?arnumber=10542733","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,25]],"date-time":"2024-06-25T20:35:01Z","timestamp":1719347701000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10542733\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3407766","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}