{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T14:26:34Z","timestamp":1766067994907,"version":"3.37.3"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3414139","type":"journal-article","created":{"date-parts":[[2024,6,13]],"date-time":"2024-06-13T18:16:45Z","timestamp":1718302605000},"page":"158103-158109","source":"Crossref","is-referenced-by-count":2,"title":["Fault Detection of Electrical Yield Meter Based on Electrical Resistance Tomography"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-6032-0229","authenticated-orcid":false,"given":"Keyi","family":"Fu","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3473-2704","authenticated-orcid":false,"given":"Shihong","family":"Yue","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Donghua","family":"Luo","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liping","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/12\/8\/302"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0955-5986(03)00024-4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s11633-020-1250-3"},{"article-title":"Electrical impedance tomography design and calculation technology for fraction estimation in dredging engineering","year":"2022","author":"Xin","key":"ref4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2016.07.494"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1680\/jmaen.2017.22"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/s0959-1524(01)00050-6"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2017.08.811"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s20195697"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC48687.2022.9806706"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2923864"},{"volume-title":"Principal Component Analysis","year":"2002","author":"Jolliffe","key":"ref12"},{"key":"ref13","first-page":"281","article-title":"Some methods for classification and analysis of multivariate observations","volume-title":"Proc. 15th Berkeley Symp. Math. Stat. Prob.","volume":"1","author":"Macqueen"},{"article-title":"Research on electrical tomography algorithm for parameter detection in dredging engineering","year":"2022","author":"Tan","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC50364.2021.9460020"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3100265"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2012.10.007"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/WISA.2015.40"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2005.845141"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2021.3129848"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1137\/130932715"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1970392.1970395"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2894049"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2023.102433"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3222125"},{"volume-title":"Operations Research","year":"2000","author":"Carter","key":"ref26"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10556547.pdf?arnumber=10556547","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,26]],"date-time":"2024-11-26T22:44:01Z","timestamp":1732661041000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10556547\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3414139","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2024]]}}}