{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T02:51:35Z","timestamp":1761965495035,"version":"3.37.3"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"Innovation and Technology Fund of Hong Kong Special Administrative Region, China","award":["MRP\/010\/21X"],"award-info":[{"award-number":["MRP\/010\/21X"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3417237","type":"journal-article","created":{"date-parts":[[2024,6,20]],"date-time":"2024-06-20T17:42:14Z","timestamp":1718905334000},"page":"134997-135013","source":"Crossref","is-referenced-by-count":1,"title":["Experimental Assessment on the Use of Power Semiconductor Filtering Technique in Grid-Connected Inverter"],"prefix":"10.1109","volume":"12","author":[{"given":"Ryan Shun-Cheung","family":"Yeung","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Centre for Smart Energy Conversion and Utilization Research, City University of Hong Kong, Hong Kong, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9732-4981","authenticated-orcid":false,"given":"Jacky Chun-Tak","family":"Lai","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Centre for Smart Energy Conversion and Utilization Research, City University of Hong Kong, Hong Kong, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7862-9931","authenticated-orcid":false,"given":"Chung-Pui","family":"Tung","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Centre for Smart Energy Conversion and Utilization Research, City University of Hong Kong, Hong Kong, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4890-8256","authenticated-orcid":false,"given":"Henry Shu-Hung","family":"Chung","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Centre for Smart Energy Conversion and Utilization Research, City University of Hong Kong, Hong Kong, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2280672"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2441299"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2714143"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2217725"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2279191"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2015.2507203"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2411851"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2274416"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2266892"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2279206"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2015.2464699"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2304468"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2565598"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2012.0032"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2478738"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2013.0666"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2341584"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2031804"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2199133"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2161738"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/28.673716"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2013.6505737"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2218133"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2477486"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2441117"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2608355"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2637078"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2440393"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2699038"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2658189"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2871257"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2924551"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3037416"},{"volume-title":"Normally OFF Silicon Carbide Junction Transistor, GA20JT12-263, Rev. 1, GeneSiC Semiconductor","year":"2015","key":"ref34"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10565867.pdf?arnumber=10565867","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,2]],"date-time":"2024-10-02T18:32:13Z","timestamp":1727893933000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10565867\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3417237","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2024]]}}}