{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,3]],"date-time":"2026-01-03T06:29:10Z","timestamp":1767421750612,"version":"3.37.3"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3418986","type":"journal-article","created":{"date-parts":[[2024,6,24]],"date-time":"2024-06-24T20:08:16Z","timestamp":1719259696000},"page":"89599-89612","source":"Crossref","is-referenced-by-count":3,"title":["Optimal Multi-Tooth Numbers for Vernier PM Synchronous Machines"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7293-5927","authenticated-orcid":false,"given":"Yinzhao","family":"Zheng","sequence":"first","affiliation":[{"name":"Department of Electronic and Electrical Engineering, The University of Sheffield, Sheffield, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7175-3307","authenticated-orcid":false,"given":"Zi-Qiang","family":"Zhu","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, The University of Sheffield, Sheffield, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-5156-4460","authenticated-orcid":false,"given":"Hai","family":"Xu","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, The University of Sheffield, Sheffield, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-6352-7224","authenticated-orcid":false,"given":"Jun","family":"Yan","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, The University of Sheffield, Sheffield, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1574-9810","authenticated-orcid":false,"given":"Dawei","family":"Liang","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, The University of Sheffield, Sheffield, U.K."}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/cp:19950864"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/28.887204"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2196417"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2352365"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1999.799197"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2030211"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2434931"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2022.3184488"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2044636"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2157309"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2019.8922263"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2237392"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2724505"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2930026"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2880144"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2913827"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3088331"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2018.2865517"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2014.7013439"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3041658"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2016.2514345"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2758747"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2778686"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2023.3303287"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2698077"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2936022"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2933657"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2951107"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CIEEC54735.2022.9846148"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2600649"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2706764"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2877165"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2157324"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.30941\/CESTEMS.2023.00015"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC55163.2023.10239026"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2835417"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3156904"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2009.5275665"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10570479.pdf?arnumber=10570479","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,5]],"date-time":"2024-07-05T04:04:54Z","timestamp":1720152294000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10570479\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3418986","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2024]]}}}