{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T20:03:41Z","timestamp":1780344221734,"version":"3.54.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100013352","name":"Dongguan Science and Technology of Social Development Program","doi-asserted-by":"publisher","award":["20231800940532"],"award-info":[{"award-number":["20231800940532"]}],"id":[{"id":"10.13039\/501100013352","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Songshan Lake Sci-Tech Commissioner Program","award":["20234373-01KCJ-G"],"award-info":[{"award-number":["20234373-01KCJ-G"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3453931","type":"journal-article","created":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T17:33:07Z","timestamp":1725384787000},"page":"124160-124170","source":"Crossref","is-referenced-by-count":21,"title":["Steel Surface Defect Detection Method Based on Improved YOLOv9 Network"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-0980-6509","authenticated-orcid":false,"given":"Jialin","family":"Zou","sequence":"first","affiliation":[{"name":"School of Computer Science and Technology, Dongguan University of Technology, Dongguan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hongcheng","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/icemi.2007.4351196"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.4316\/aece.2022.02009"},{"key":"ref3","article-title":"YOLOv9: Learning what you want to learn using programmable gradient information","author":"Wang","year":"2024","journal-title":"arXiv:2402.13616"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.89"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1807.06521"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2019.2915404"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3389\/fbioe.2021.810876"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2023.3238524"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-018-1415-x"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.2970461"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CAC59555.2023.10450211"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s40747-023-01180-7"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/met13081439"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3277989"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2941752"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3176239"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109454"},{"key":"ref18","article-title":"MobileNets: Efficient convolutional neural networks for mobile vision applications","author":"Howard","year":"2017","journal-title":"arXiv:1704.04861"},{"key":"ref19","article-title":"Very deep convolutional networks for large-scale image recognition","author":"Simonyan","year":"2014","journal-title":"arXiv:1409.1556"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/app12188972"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00612"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2019.2944979"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICIBA56860.2023.10165260"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10663548.pdf?arnumber=10663548","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,12]],"date-time":"2024-09-12T18:01:02Z","timestamp":1726164062000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10663548\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3453931","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}