{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,21]],"date-time":"2026-07-21T04:40:19Z","timestamp":1784608819449,"version":"3.55.0"},"reference-count":52,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"European Union through the REFRESH\u2014Research Excellence for Region Sustainability and High-Tech Industries via the Operational Program Just Transition","award":["CZ.10.03.01\/00\/22_003\/0000048"],"award-info":[{"award-number":["CZ.10.03.01\/00\/22_003\/0000048"]}]},{"DOI":"10.13039\/501100015000","name":"National Centre for Energy II and ExPEDite Project a Research and Innovation Action to Support the Implementation of the Climate Neutral and Smart Cities Mission Project","doi-asserted-by":"publisher","award":["TN02000025"],"award-info":[{"award-number":["TN02000025"]}],"id":[{"id":"10.13039\/501100015000","id-type":"DOI","asserted-by":"publisher"}]},{"name":"European Union\u2019s Horizon Mission Program through ExPEDite","award":["101139527"],"award-info":[{"award-number":["101139527"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3459474","type":"journal-article","created":{"date-parts":[[2024,9,12]],"date-time":"2024-09-12T17:58:57Z","timestamp":1726163937000},"page":"132729-132743","source":"Crossref","is-referenced-by-count":21,"title":["Noise Source Effect on the Quality of Mother Wavelet Selection for Partial Discharge Denoising"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-4129-8171","authenticated-orcid":false,"given":"Mohamed A.","family":"Sahnoune","sequence":"first","affiliation":[{"name":"Laboratoire d’Étude et de Développement des Matériaux Semiconducteurs et diÉlectriques, Amar Telidji University of Laghouat, Laghouat, Algeria"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Boubakeur","family":"Zegnini","sequence":"additional","affiliation":[{"name":"Laboratoire d’Étude et de Développement des Matériaux Semiconducteurs et diÉlectriques, Amar Telidji University of Laghouat, Laghouat, Algeria"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tahar","family":"Seghier","sequence":"additional","affiliation":[{"name":"Laboratoire d’Étude et de Développement des Matériaux Semiconducteurs et diÉlectriques, Amar Telidji University of Laghouat, Laghouat, Algeria"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3463-6096","authenticated-orcid":false,"given":"Aymen","family":"Flah","sequence":"additional","affiliation":[{"name":"National Engineering School of Gabes, University of Gabes, Gabes, Tunisia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mohammad","family":"Kanan","sequence":"additional","affiliation":[{"name":"Industrial Engineering Department, College of Engineering, University of Business and Technology (UBT), Jeddah, Saudi Arabia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0495-5499","authenticated-orcid":false,"given":"Lukas","family":"Prokop","sequence":"additional","affiliation":[{"name":"VSB-Technical University of Ostrava, Ostrava, Czech Republic"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8268-8878","authenticated-orcid":false,"given":"Claude Ziad","family":"El-Bayeh","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Bayeh Institute, Amchit, Lebanon"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/9781119568414.ch1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-023-01935-y"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1155\/2024\/5676986"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-31676-1_47"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.36001\/phmconf.2016.v8i1.2584"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3075288"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CONIT59222.2023.10205551"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDC.2005.1546916"},{"issue":"1971","key":"ref9","doi-asserted-by":"crossref","first-page":"903","DOI":"10.1098\/rspa.1998.0193","article-title":"The empirical mode decomposition and the Hilbert spectrum for nonlinear and non-stationary time series analysis","volume":"454","author":"Huang","year":"1998","journal-title":"Proc. Roy. Soc. London. Ser. A, Math., Phys. Eng. Sci."},{"key":"ref10","volume-title":"Mathematical Morphology and Its Applications to Image and Signal Processing","author":"Maragos","year":"2012"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-03613-2"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s11276-023-03398-2"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2322114"},{"issue":"8","key":"ref14","first-page":"8","article-title":"FFT analysis on partial discharge modeling of transformer solid insulation","volume":"8","author":"Ranga","year":"2016","journal-title":"Digit. Signal Process."},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3210519"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1137\/1.9780898719727"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/18.57199"},{"key":"ref18","volume-title":"The Wavelet Tutorial","year":"2024"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2996717"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3006140"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.108970"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2023.3269725"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2021.009662"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2023.3331663"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/SCOReD50371.2020.9250942"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3032012"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/en14113267"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113674"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/1757-899X\/857\/1\/012020"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2020.0061"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2022.104230"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2022.3183662"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112882"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3116491"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3071224"},{"issue":"4","key":"ref36","first-page":"291","article-title":"De-noising of partial discharge signals in HV XLPE cables by reference noise based on the wavelet transform","volume":"6","author":"Ghaedi","year":"2023","journal-title":"Int. J. Ind. Electron. Control Optim."},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3035249"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.120067"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3279355"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2023.109838"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3363790"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2024.3393993"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.112163"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.3390\/app10062162"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-31676-1_48"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2019.0081"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2020.1825554"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2003.1194122"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2474122"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2014.07.057"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/SSD54932.2022.9955884"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1016\/j.asr.2022.01.023"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10679118.pdf?arnumber=10679118","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,3]],"date-time":"2024-10-03T05:33:33Z","timestamp":1727933613000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10679118\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":52,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3459474","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}