{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T21:42:29Z","timestamp":1779313349345,"version":"3.51.4"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62103256"],"award-info":[{"award-number":["62103256"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Foundation of Scientific and Technological Breakthroughs Project for Social Development under Shanghai Science and Technology Innovation Action Plan","doi-asserted-by":"publisher","award":["21DZ1205000"],"award-info":[{"award-number":["21DZ1205000"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3464741","type":"journal-article","created":{"date-parts":[[2024,9,20]],"date-time":"2024-09-20T17:26:04Z","timestamp":1726853164000},"page":"138362-138371","source":"Crossref","is-referenced-by-count":5,"title":["An Improved Multiscale Semantic Enhancement Network for Aluminum Defect Detection"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3230-7181","authenticated-orcid":false,"given":"Tingting","family":"Sui","sequence":"first","affiliation":[{"name":"School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-5804-5952","authenticated-orcid":false,"given":"Junwen","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2023.3295741"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-023-14478-y"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-023-16976-5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.59543\/ijmscs.v2i.7815"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3389\/fphy.2022.1099261"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/rs15184393"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuri.2021.100035"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2022.107819"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.54216\/JAIM.060204"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2023.01.088"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-13-9042-5_56"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.conbuildmat.2022.129659"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-022-07940-9"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103551"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109316"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1177\/03611981211019034"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN48605.2020.9207574"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.53469\/jtpes.2023.03(12).06"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-55180-3_37"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3230894"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/s22093467"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/s22093537"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0259283"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/jmse10030377"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12102323"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/s23208361"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-023-08809-1"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/machines11070677"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICACSIS56558.2022.9923484"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2021.3120009"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2023.110748"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.jeconom.2022.03.007"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3232842"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3428618"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2024.3376449"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.3390\/rs13214209"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2023.168694"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-023-15495-7"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3390\/s23135992"},{"issue":"24","key":"ref40","article-title":"Traffic sign detection algorithm based on improved anchor free model","volume":"29","author":"Lu","year":"2022","journal-title":"Laser Optoelectron. Prog."},{"issue":"6","key":"ref41","article-title":"A small target detection network based on adaptive feature enhancement","volume":"60","author":"Wu","year":"2023","journal-title":"Laser Optoelectron. Prog."}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10684690.pdf?arnumber=10684690","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,10]],"date-time":"2024-10-10T11:25:10Z","timestamp":1728559510000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10684690\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3464741","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}