{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:28:32Z","timestamp":1772119712397,"version":"3.50.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"APR Corporation in Seoul, South Korea"},{"DOI":"10.13039\/501100002643","name":"Research Grant of Kwangwoon University in 2024","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002643","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3469090","type":"journal-article","created":{"date-parts":[[2024,9,26]],"date-time":"2024-09-26T17:48:56Z","timestamp":1727372936000},"page":"142677-142694","source":"Crossref","is-referenced-by-count":6,"title":["A 3.5 to 4.7-GHz Fractional-N ADPLL With a Low-Power Time-Interleaved GRO-TDC of 6.2-ps Resolution in 65-nm CMOS Process"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-2491-3148","authenticated-orcid":false,"given":"Kyoung-Ub","family":"Cho","sequence":"first","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1789-6777","authenticated-orcid":false,"given":"Joonho","family":"Gil","sequence":"additional","affiliation":[{"name":"Nemesis Company Ltd., Seongnam, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-1653-2435","authenticated-orcid":false,"given":"Chulhyun","family":"Park","sequence":"additional","affiliation":[{"name":"Nemesis Company Ltd., Seongnam, Republic of Korea"}]},{"given":"Kyu-Jin","family":"Cho","sequence":"additional","affiliation":[{"name":"APR Corporation, Seoul, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2803-3010","authenticated-orcid":false,"given":"Jae-Woo","family":"Shin","sequence":"additional","affiliation":[{"name":"APR Corporation, Seoul, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2440-9228","authenticated-orcid":false,"given":"Eun-Seong","family":"Kim","sequence":"additional","affiliation":[{"name":"RFIC Center, Kwangwoon University, Seoul, Republic of Korea"}]},{"given":"Yun-Seong","family":"Eo","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7691-566X","authenticated-orcid":false,"given":"Ramesh","family":"Harjani","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4264-2928","authenticated-orcid":false,"given":"Nam-Young","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6574-0590","authenticated-orcid":false,"given":"Taehyoun","family":"Oh","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, Republic of Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2009.2024663"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/cicc.2015.7338394"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2002.808305"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/cicc.2014.6945999"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2627369.2631639"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2003.1250885"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3090056"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3144974"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2252513"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2047439"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3343470"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3182158"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3314403"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2005704"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2014709"},{"key":"ref16","article-title":"Noise shaping techniques for analog and time to digital converters using voltage controlled oscillator","author":"Straayer","year":"2008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2008.4585960"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/4.551926"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.889443"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2024.3367177"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2949732"},{"key":"ref22","first-page":"560","article-title":"Switched-capacitor circuits","volume-title":"Analog Integrated Circuit Design","author":"Carusone","year":"2012"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2004.1320548"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2342671"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.800969"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2006.1651102"},{"key":"ref27","article-title":"Analysis and solutions for phase noise degradation by the AM-FM conversions in CMOS LC-VCO","author":"Shin","year":"2009"},{"key":"ref28","volume-title":"Voltage-controlled oscillator decreasing phase noise","author":"Shin","year":"2009"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3059484"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3208869"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/iscas51556.2021.9401328"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2016.2609855"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2018.2848218"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2021.3105552"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3224451"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2023.3320886"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10695074.pdf?arnumber=10695074","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,10]],"date-time":"2024-10-10T11:23:39Z","timestamp":1728559419000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10695074\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3469090","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}