{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:23:02Z","timestamp":1740169382964,"version":"3.37.3"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003052","name":"Ministry of Trade, Industry, and Energy","doi-asserted-by":"publisher","award":["1415180306"],"award-info":[{"award-number":["1415180306"]}],"id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100020088","name":"Korea Semiconductor Research Consortium (KSRC), Development of the Future Semiconductor Device","doi-asserted-by":"publisher","award":["20019164"],"award-info":[{"award-number":["20019164"]}],"id":[{"id":"10.13039\/501100020088","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3475229","type":"journal-article","created":{"date-parts":[[2024,10,7]],"date-time":"2024-10-07T17:46:18Z","timestamp":1728323178000},"page":"146463-146475","source":"Crossref","is-referenced-by-count":0,"title":["An Efficient Scan Diagnosis for Intermittent Faults Using CNN With Multi-Channel Data"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-6443-5918","authenticated-orcid":false,"given":"Hyojun","family":"Yun","sequence":"first","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hyeonchan","family":"Lim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6868-0829","authenticated-orcid":false,"given":"Hayoung","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Intelligence Semiconductor Engineering, Ajou University, Suwon-si, Gyeonggi-do, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-7037-8318","authenticated-orcid":false,"given":"Doohyun","family":"Yoon","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7093-2095","authenticated-orcid":false,"given":"Sungho","family":"Kang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3076282"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2354752"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1992.232749"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512645"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639683"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3108429"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3200923"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1999.810744"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386946"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.66"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.31399\/asm.cp.istfa2008p0396"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/54.970425"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.896939"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.848800"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364644"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2006.258152"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060205"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.36"},{"key":"ref19","first-page":"157","article-title":"Quick scan chain diagnosis using signal profiling","volume-title":"Proc. Int. Conf. Comput. Design","author":"Yang"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269035"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2186298"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2017.50"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287692"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2957356"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/s20174771"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538761"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2363152"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2907500"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/3065386"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.308"},{"volume-title":"TensorFlow: Large-Scale Machine Learning on Heterogeneous Distributed Systems","year":"2015","author":"Abadi","key":"ref33"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10706206.pdf?arnumber=10706206","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T00:56:58Z","timestamp":1732669018000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10706206\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3475229","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2024]]}}}