{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,22]],"date-time":"2026-07-22T19:33:20Z","timestamp":1784748800720,"version":"3.55.0"},"reference-count":101,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"NSF Center for Hardware and Embedded System Security and Trust Industry-University Cooperative Research Centers","award":["CNS 1916722"],"award-info":[{"award-number":["CNS 1916722"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3479929","type":"journal-article","created":{"date-parts":[[2024,10,14]],"date-time":"2024-10-14T17:25:51Z","timestamp":1728926751000},"page":"150623-150638","source":"Crossref","is-referenced-by-count":6,"title":["A Survey of Electromagnetic Radiation Based Hardware Assurance and Reliability Monitoring Methods in Integrated Circuits"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-2104-8358","authenticated-orcid":false,"given":"Manoj Yasaswi","family":"Vutukuru","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Cincinnati, Cincinnati, OH, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6074-535X","authenticated-orcid":false,"given":"John M.","family":"Emmert","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Cincinnati, Cincinnati, OH, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2656-5945","authenticated-orcid":false,"given":"Rashmi","family":"Jha","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Cincinnati, Cincinnati, OH, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Counterfeit Electronic Parts: A Multibillion-Dollar Black Market","author":"Daniel","year":"2024"},{"key":"ref2","volume-title":"Counterfeit Electronic Parts in the Department of Defense Supply Chain","year":"2024"},{"key":"ref3","volume-title":"Elimination of Counterfeiting","year":"2024"},{"key":"ref4","volume-title":"2017 Erai Reported Parts Analysis","author":"Akhoundov","year":"2024"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-16344-9_13"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3288696"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3584944"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"135","DOI":"10.1016\/j.vlsi.2019.02.006","article-title":"Survey on recent counterfeit IC detection techniques and future research directions","volume":"66","author":"Oriero","year":"2019","journal-title":"Integration"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3047976"},{"issue":"9","key":"ref10","doi-asserted-by":"crossref","first-page":"1420","DOI":"10.3390\/electronics11091420","article-title":"Bias temperature instability of MOSFETs: Physical processes, models, and prediction","volume":"11","author":"Zhang","year":"2022","journal-title":"Electronics"},{"issue":"21","key":"ref11","doi-asserted-by":"crossref","first-page":"3601","DOI":"10.3390\/electronics11213601","article-title":"Hot carrier injection reliability in nanoscale field effect transistors: Modeling and simulation methods","volume":"11","author":"Wang","year":"2022","journal-title":"Electronics"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.1994.383337"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/FPL50879.2020.00037"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2015.7282148"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3569052.3578919"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2014.6927390"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2016.2622688"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2013.2253795"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2014.6742929"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3695247"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/PAINE54418.2021.9707703"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON49338.2021.9696415"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45418-7_17"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"43","DOI":"10.1016\/j.diin.2019.03.002","article-title":"A survey of electromagnetic side-channel attacks and discussion on their case-progressing potential for digital forensics","volume":"29","author":"Sayakkara","year":"2019","journal-title":"Digit. Invest."},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2021.3135324"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2727985"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2010.5617413"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218514"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2022.3161001"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1143\/jjap.5.180"},{"issue":"2","key":"ref31","doi-asserted-by":"crossref","first-page":"268","DOI":"10.1109\/JSSC.1979.1051173","article-title":"1 \u03bcm MOSFET VLSI technology. IV. Hot-electron design constraints","volume":"SSC-14","author":"Ning","year":"1979","journal-title":"IEEE J. Solid-State Circuits"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1985.1052306"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2002.1003712"},{"issue":"9","key":"ref34","doi-asserted-by":"crossref","first-page":"1199","DOI":"10.1016\/j.microrel.2010.07.017","article-title":"Reliability of advanced high-k\/metal-gate n-FET devices","volume":"50","author":"Stathis","year":"2010","journal-title":"Microelectron. Rel."},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"issue":"1","key":"ref36","doi-asserted-by":"crossref","first-page":"71","DOI":"10.1016\/j.microrel.2004.03.019","article-title":"A comprehensive model of PMOS NBTI degradation","volume":"45","author":"Alam","year":"2005","journal-title":"Microelectron. Rel."},{"issue":"1","key":"ref37","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/j.microrel.2005.02.001","article-title":"NBTI degradation: From physical mechanisms to modelling","volume":"46","author":"Huard","year":"2006","journal-title":"Microelectron. Rel."},{"issue":"2","key":"ref38","doi-asserted-by":"crossref","first-page":"270","DOI":"10.1016\/j.microrel.2005.08.001","article-title":"The negative bias temperature instability in MOS devices: A review","volume":"46","author":"Stathis","year":"2006","journal-title":"Microelectron. Rel."},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2023.3253081"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1983.190525"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269294"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1063\/1.1604480"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1997.649463"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1201\/b12722-1"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2020.3003003"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.9723\/jksiis.2013.18.1.019"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/1123008.1123017"},{"key":"ref48","first-page":"1","volume-title":"Understand and avoid electromigration (EM) & IR-drop in custom IP blocks","author":"Geden","year":"2011"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16754"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-73558-0_2"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936344"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON58068.2023.10366049"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2009.2033577"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2008.2008907"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2949733"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-15462-2_10"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3300222"},{"key":"ref58","first-page":"27","article-title":"Near field measurements to predict the electromagnetic emission of integrated circuits","volume-title":"Proc. 5th Int. Workshop Electromagn. Compat. Integr. Circuits","author":"Deutschmann"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/MEMC.2023.10136447"},{"key":"ref60","volume-title":"AES Proposal: Rijndael","author":"Daemen","year":"1999"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1145\/357980.358017"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2014.2354018"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2014.2361433"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.814685"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2020.3000562"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3025022"},{"issue":"4","key":"ref67","doi-asserted-by":"crossref","first-page":"30","DOI":"10.3390\/cryptography4040030","article-title":"Electromagnetic and power side-channel analysis: Advanced attacks and low-overhead generic countermeasures through white-box approach","volume":"4","author":"Das","year":"2020","journal-title":"Cryptography"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON61878.2024.10670674"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEUROPE48519.2020.9245675"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855574"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2015.7256167"},{"key":"ref73","volume-title":"Trusthub","year":"2024"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/ICASID.2017.8285773"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1117\/12.2304450"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2019.2914079"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1145\/3419105"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/APEMC53576.2022.9888518"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.23919\/cje.2022.00.310"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3078000"},{"issue":"24","key":"ref81","doi-asserted-by":"crossref","first-page":"8288","DOI":"10.3390\/s21248288","article-title":"Intelligent electromagnetic sensors for non-invasive trojan detection","volume":"21","author":"Chen","year":"2021","journal-title":"Sensors"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEurope.2014.6931070"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2017.2750078"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624679"},{"key":"ref85","doi-asserted-by":"crossref","first-page":"S94","DOI":"10.1016\/j.diin.2019.04.012","article-title":"Leveraging electromagnetic side-channel analysis for the investigation of IoT devices","volume":"29","author":"Sayakkara","year":"2019","journal-title":"Digit. Invest."},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1186\/s13638-020-01808-z"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2019.2903232"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3223998"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2023.3303591"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEurope.2014.6931074"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1109\/CADS.2017.8310673"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2008.4652103"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1109\/APEMC.2010.5475776"},{"key":"ref94","article-title":"Influence of aging and environnement conditions on emc performances of electronic equipment-influence of passive vs active components","volume-title":"Proc. EMC Eur.","author":"Lafon"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-012-5335-y"},{"key":"ref96","first-page":"759","article-title":"Effect of electrical stresses on the susceptibility of a voltage regulator","volume-title":"Proc. Int. Symp. Electromagn. Compat.","author":"Wu"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2013.2272195"},{"key":"ref98","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2012.2226542"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.1109\/IESPC.2017.8071868"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2821196"},{"key":"ref101","doi-asserted-by":"publisher","DOI":"10.1017\/S1759078722000599"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/6287639\/10380310\/10716470-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10716470.pdf?arnumber=10716470","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T00:53:15Z","timestamp":1732668795000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10716470\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":101,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3479929","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}