{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T08:23:18Z","timestamp":1774599798220,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100017688","name":"Open Foundation of Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100017688","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018552","name":"Science and Technology Plan Project of Guangzhou Zengcheng District","doi-asserted-by":"publisher","award":["2024ZCKJ04"],"award-info":[{"award-number":["2024ZCKJ04"]}],"id":[{"id":"10.13039\/501100018552","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3486176","type":"journal-article","created":{"date-parts":[[2024,10,24]],"date-time":"2024-10-24T17:28:48Z","timestamp":1729790928000},"page":"158436-158445","source":"Crossref","is-referenced-by-count":13,"title":["PCB-DETR: A Detection Network of PCB Surface Defect With Spatial Attention Offset Module"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-2380-0187","authenticated-orcid":false,"given":"Qifeng","family":"Li","sequence":"first","affiliation":[{"name":"School of Computer Engineering, Guangzhou City University of Technology, Huadu, Guangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2780-4052","authenticated-orcid":false,"given":"Lihao","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Computer Engineering, Guangzhou City University of Technology, Huadu, Guangzhou, China"}]},{"given":"Huangpei","family":"Xiao","sequence":"additional","affiliation":[{"name":"School of Computer Engineering, Guangzhou City University of Technology, Huadu, Guangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0190-0620","authenticated-orcid":false,"given":"Chuangmian","family":"Huang","sequence":"additional","affiliation":[{"name":"Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12092120"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2021.3136823"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/pr11030775"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s12065-024-00930-x"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3095410"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IWCMC48107.2020.9148132"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3013277"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s13042-024-02264-7"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s23218780"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2023.103911"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3330142"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2019.101004"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3245093"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.08.019"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.32604\/cmc.2022.017698"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12102306"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3153997"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9091547"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/trit.2019.0019"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/su15075963"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58452-8_13"},{"key":"ref23","article-title":"Deformable DETR: Deformable transformers for end-to-end object detection","author":"Zhu","year":"2020","journal-title":"arXiv:2010.04159"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/systems11070372"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00475"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/s24134077"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-022-03659-1"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2023.3299985"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-44207-0_24"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/s24113610"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10734096.pdf?arnumber=10734096","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T03:41:19Z","timestamp":1732678879000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10734096\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3486176","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}