{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T14:51:30Z","timestamp":1774536690174,"version":"3.50.1"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100002543","name":"2024 Specialization Project of Pusan National University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3498903","type":"journal-article","created":{"date-parts":[[2024,11,15]],"date-time":"2024-11-15T18:49:48Z","timestamp":1731696588000},"page":"170570-170580","source":"Crossref","is-referenced-by-count":8,"title":["Retention Characteristics Dependent on High-\u03ba Gate-Insulator Stack in Hf-ZnO Synaptic Thin-Film Transistors"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-6997-3130","authenticated-orcid":false,"given":"Gyoungyeop","family":"do","sequence":"first","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4713-7579","authenticated-orcid":false,"given":"Danyoung","family":"Cha","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-8938-4110","authenticated-orcid":false,"given":"Kunhee","family":"Tae","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-9443-1381","authenticated-orcid":false,"given":"Nayeong","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-3601-4788","authenticated-orcid":false,"given":"Seokhyun","family":"Byun","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-5639-2793","authenticated-orcid":false,"given":"Jeongseok","family":"Pi","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5523-8476","authenticated-orcid":false,"given":"Sungsik","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10753578.pdf?arnumber=10753578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,26]],"date-time":"2024-11-26T18:52:11Z","timestamp":1732647131000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10753578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3498903","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}