{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T14:51:28Z","timestamp":1774536688041,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100002543","name":"2024 Specialization Project of Pusan National University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3505925","type":"journal-article","created":{"date-parts":[[2024,11,26]],"date-time":"2024-11-26T18:51:40Z","timestamp":1732647100000},"page":"179813-179822","source":"Crossref","is-referenced-by-count":8,"title":["Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-8938-4110","authenticated-orcid":false,"given":"Kunhee","family":"Tae","sequence":"first","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4713-7579","authenticated-orcid":false,"given":"Danyoung","family":"Cha","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-6997-3130","authenticated-orcid":false,"given":"Gyoungyeop","family":"do","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-9443-1381","authenticated-orcid":false,"given":"Nayeong","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5523-8476","authenticated-orcid":false,"given":"Sungsik","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Pusan National University, Busan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1039\/D1NR00148E"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/aae223"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2020.3047963"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/aade3f"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201903700"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3366224"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202400108"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-022-26123-z"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.77.1083"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2007.380"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1021\/nn5059419"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2639539"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1609245"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/1521-3951(200107)226:1<57::AID-PSSB57>3.0.CO;2-L"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.3640221"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201401354"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2318751"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1116\/1.5047237"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1116\/1.4880823"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/cryst9040192"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.17863\/CAM.6502"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.cap.2013.01.004"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3162929"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ab2303"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.surfcoat.2020.125352"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/27\/7\/074011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/S0040-6090(02)00612-0"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1021\/cm020607+"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.7b10136"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1063\/1.1609233"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1002\/pssc.200982419"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1021\/la980623e"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuron.2017.02.047"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1146\/annurev.physiol.64.092501.114547"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/EDSSC.2014.7061207"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10380310\/10767843.pdf?arnumber=10767843","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T02:19:04Z","timestamp":1733883544000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10767843\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3505925","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}