{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,11]],"date-time":"2025-01-11T05:35:32Z","timestamp":1736573732051,"version":"3.32.0"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3525564","type":"journal-article","created":{"date-parts":[[2025,1,2]],"date-time":"2025-01-02T19:32:30Z","timestamp":1735846350000},"page":"5193-5202","source":"Crossref","is-referenced-by-count":0,"title":["ILN-YOLOv8: A Lightweight Image Recognition Model for Crimped Wire Connectors"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-8264-1059","authenticated-orcid":false,"given":"Xiaojian","family":"Zhou","sequence":"first","affiliation":[{"name":"College of Information Engineering, Hainan Vocational University of Science and Technology, Haikou, Hainan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1142-4293","authenticated-orcid":false,"given":"Jicheng","family":"Kan","sequence":"additional","affiliation":[{"name":"College of Information Engineering, Hainan Vocational University of Science and Technology, Haikou, Hainan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0289-0337","authenticated-orcid":false,"given":"Nur","family":"Fatin Liyana Mohd Rosely","sequence":"additional","affiliation":[{"name":"Faculty of Data Science and Information Technology, INTI International University, Nilai, Negeri Sembilan, Malaysia"}]},{"given":"Xu","family":"Duan","sequence":"additional","affiliation":[{"name":"College of Information Engineering, Hainan Vocational University of Science and Technology, Haikou, Hainan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4751-3028","authenticated-orcid":false,"given":"Jiajing","family":"Cai","sequence":"additional","affiliation":[{"name":"College of Information Engineering, Hainan Vocational University of Science and Technology, Haikou, Hainan, China"}]},{"given":"Zihan","family":"Zhou","sequence":"additional","affiliation":[{"name":"University of International Business and Economics, Chaoyang, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HOLM.2008.ECP.39"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/6508289"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.4914807"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2021.11.213"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/iSPEC48194.2019.8974860"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/eng2.12912"},{"volume-title":"Process for nondestructive evaluation of the quality of a crimped wire connector","year":"2014","author":"Yost","key":"ref7"},{"article-title":"Abnormality monitoring device for terminal crimping device","year":"2017","author":"Harutomo","key":"ref8"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2022.108148"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/EDPC51184.2020.9388203"},{"issue":"18","key":"ref11","first-page":"297","article-title":"Detection algorithm of wire harness terminal core based on improved efficientdet","volume":"59","author":"Shisong","year":"2022","journal-title":"Laser Optoelectronics Prog."},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-99-8469-5_27"},{"key":"ref13","article-title":"ELA: Efficient local attention for deep convolutional neural networks","author":"Xu","year":"2024","journal-title":"arXiv:2403.01123"},{"key":"ref14","article-title":"MPDIoU: A loss for efficient and accurate bounding box regression","author":"Ma","year":"2023","journal-title":"arXiv:2307.07662"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.00554"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1911.08287"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3439567"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.atech.2024.100648"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.aej.2024.07.004"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s23208361"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/rs15082071"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3484156"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/FG.2017.82"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00667"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01157"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-024-01436-6"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10820347.pdf?arnumber=10820347","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T20:46:53Z","timestamp":1736542013000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10820347\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3525564","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}