{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,17]],"date-time":"2026-02-17T03:11:12Z","timestamp":1771297872016,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001321","name":"National Research Foundation","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100001321","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Institute of Information and Communications Technology Planning and Evaluation (IITP) through the Korean Government","award":["2022M3F3A2A01073562"],"award-info":[{"award-number":["2022M3F3A2A01073562"]}]},{"name":"Institute of Information and Communications Technology Planning and Evaluation (IITP) through the Korean Government","award":["2022M3I7A2079267"],"award-info":[{"award-number":["2022M3I7A2079267"]}]},{"name":"Institute of Information and Communications Technology Planning and Evaluation (IITP) through the Korean Government","award":["RS-2023-00229028"],"award-info":[{"award-number":["RS-2023-00229028"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3531982","type":"journal-article","created":{"date-parts":[[2025,1,20]],"date-time":"2025-01-20T18:59:11Z","timestamp":1737399551000},"page":"32808-32818","source":"Crossref","is-referenced-by-count":1,"title":["Analysis of Low Area Digital Up\/Down Clipping Counter for Digital In-Memory Computing"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-1340-4416","authenticated-orcid":false,"given":"Siyeol","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Electronics Engineering, Incheon National University, Incheon, Republic of Korea"}]},{"given":"Geonwoo","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Incheon National University, Incheon, Republic of Korea"}]},{"given":"Seongmin","family":"Ahn","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Incheon National University, Incheon, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8823-0625","authenticated-orcid":false,"given":"Taehui","family":"Na","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Incheon National University, Incheon, Republic of Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nature14539"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2018.8351354"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/jetcas.2022.3160455"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2021.3073254"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-021-23719-3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/mssc.2019.2922889"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-020-0655-z"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202270041"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tencon58879.2023.10322327"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2022.3154025"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-021-04196-6"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342235"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3010795"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2022.3169759"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/itc-cscc58803.2023.10212962"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2023.3241446"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/iccsp.2017.8286619"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICICV50876.2021.9388445"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/4.5951"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2011.70"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2011.6144556"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICECTECH.2011.5941973"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/GCAT59970.2023.10353293"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2002.808446"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10847857.pdf?arnumber=10847857","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T05:23:15Z","timestamp":1740460995000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10847857\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3531982","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}