{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T22:24:17Z","timestamp":1772490257603,"version":"3.50.1"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Research Project of Korea Electric Power Company","award":["R23TA16"],"award-info":[{"award-number":["R23TA16"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3532805","type":"journal-article","created":{"date-parts":[[2025,1,22]],"date-time":"2025-01-22T18:57:45Z","timestamp":1737572265000},"page":"24287-24294","source":"Crossref","is-referenced-by-count":1,"title":["Mechanical Wear Characteristics of 170 kV Gas-Insulated Switchgear Circuit-Breaker Contacts Before Arc Initiation: An Accelerated Lifetime Test Approach"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-0813-4836","authenticated-orcid":false,"given":"Jong-Geon","family":"Lee","sequence":"first","affiliation":[{"name":"Korea Electric Power Research Institute (KEPRI), Daejeon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jae-Hong","family":"Koo","sequence":"additional","affiliation":[{"name":"Korea Electric Power Research Institute (KEPRI), Daejeon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Reliability of HV\/MV substations with air-isolated and gas-insulated switchgear","author":"Peric","year":"2014"},{"key":"ref2","volume-title":"Residual life concepts applied to HV GIS","year":"2012"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2006.876661"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tcpmt.2018.2833123"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.2991234"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3277932"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2362498"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2016.2601316"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2011.2134113"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.106827"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2882013"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3207768"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2276630"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/smt2.12120"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/en16145581"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10849563.pdf?arnumber=10849563","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,20]],"date-time":"2025-02-20T20:47:16Z","timestamp":1740084436000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10849563\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3532805","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}