{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T14:55:37Z","timestamp":1773932137685,"version":"3.50.1"},"reference-count":66,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"China Scholarship Council and Sichuan Provincial Department of Education\u2019s Western Program Local Innovation Sub-Project","award":["202008510173"],"award-info":[{"award-number":["202008510173"]}]},{"name":"UAV Industry Development Research Center of Sichuan Province","award":["SCUAV22-B002"],"award-info":[{"award-number":["SCUAV22-B002"]}]},{"name":"UAV Industry Development Research Center of Sichuan Province","award":["SCUAV22-C005"],"award-info":[{"award-number":["SCUAV22-C005"]}]},{"name":"Key Project of Chengdu Technological University","award":["2024ZR007"],"award-info":[{"award-number":["2024ZR007"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3537658","type":"journal-article","created":{"date-parts":[[2025,2,3]],"date-time":"2025-02-03T18:29:08Z","timestamp":1738607348000},"page":"25578-25597","source":"Crossref","is-referenced-by-count":3,"title":["A Novel Ensemble Classifier Selection Method for Software Defect Prediction"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9060-0103","authenticated-orcid":false,"given":"Xin","family":"Dong","sequence":"first","affiliation":[{"name":"Computer Engineering College, Chengdu Technological University, Chengdu, China"}],"role":[{"role":"author","vocab":"crossref"}]},{"given":"Jie","family":"Wang","sequence":"additional","affiliation":[{"name":"Science and Technology on Electronic Information Control Laboratory, Chengdu, China"}],"role":[{"role":"author","vocab":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1617-457X","authenticated-orcid":false,"given":"Yan","family":"Liang","sequence":"additional","affiliation":[{"name":"Computer Engineering College, Chengdu Technological University, Chengdu, China"}],"role":[{"role":"author","vocab":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2017.12.011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.104773"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/8858010"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3174115"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/j.eswa.2021.114595","article-title":"ML based methods for software fault prediction: A survey","volume":"172","author":"Pandey","year":"2021","journal-title":"Expert Syst. Appl."},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.11.067"},{"issue":"2","key":"ref7","first-page":"84","article-title":"A novel imbalanced data classification method for software defects","volume":"40","author":"Liu","year":"2021","journal-title":"J. Shandong Univ. Sci. Tech., Nat. Sci."},{"key":"ref8","first-page":"2637","article-title":"Software defect number prediction method based on data oversampling and ensemble learning","volume":"38","author":"Jian","year":"2018","journal-title":"J. Comp. Appl."},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.04.090"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2014.07.005"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/08839514.2022.2145646"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2018.03.038"},{"key":"ref13","first-page":"1","article-title":"Measuring ensemble diversity and its effects on model robustness","volume-title":"Proc. IJCAI","author":"Heidemann"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2949059"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2024.111435"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/bxae101"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0303881"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10994-023-06470-2"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.32604\/cmes.2022.022985"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2731766"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1273496.1273614"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1613\/jair.953"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.117023"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.105151"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2020.07.007"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-62182-0"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-022-04427-x"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2022.08.055"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2019.113160"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/s23073470"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.32604\/cmc.2023.037933"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.jer.2023.10.038"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3262836"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1017\/S0269888923000024"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/9953509"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2022.3162121"},{"key":"ref37","volume-title":"Method and device for building a software defect prediction model based on ensemble learning","author":"Dong","year":"2024"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.34028\/iajit\/17\/5\/5"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3037235"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2022.102630"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.cor.2021.105456"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.ipm.2022.103053"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.iswa.2022.200073"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2022.08.077"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2022.108522"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2022.108611"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.116683"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.patter.2022.100520"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.3390\/app9132660"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2018.09.001"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.advengsoft.2022.103138"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2021.106664"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202409175"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3253765"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1007\/s10994-024-06558-3"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1016\/j.toxlet.2023.10.013"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.7717\/peerj-cs.1684"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1007\/s10115-022-01803-4"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.3934\/math.20231238"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.3390\/jmse11112154"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3320042"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-021-10092-4"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2018.10.004"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.23919\/JSEE.2024.000018"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.3390\/met13010169"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-024-10759-6"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10869442.pdf?arnumber=10869442","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,20]],"date-time":"2025-02-20T20:39:43Z","timestamp":1740083983000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10869442\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":66,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3537658","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}