{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T12:45:18Z","timestamp":1783687518766,"version":"3.55.0"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3538773","type":"journal-article","created":{"date-parts":[[2025,2,4]],"date-time":"2025-02-04T18:43:00Z","timestamp":1738694580000},"page":"27024-27036","source":"Crossref","is-referenced-by-count":12,"title":["Reconstruction and Classification of Brain Strokes Using Deep Learning-Based Microwave Imaging"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8668-8480","authenticated-orcid":false,"given":"Sayyed Saleh Sayyed","family":"Mousavi","sequence":"first","affiliation":[{"name":"Communications and Computer Research Center, Ferdowsi University of Mashhad, Mashhad, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5846-5773","authenticated-orcid":false,"given":"Mohammad Saeed","family":"Majedi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Ferdowsi University of Mashhad, Mashhad, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/3238165"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1177\/17474930211065917"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JERM.2022.3227724"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1212\/WNL.55.11.1649"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s11910-996-0003-1"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MAP.2017.2732225"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s11517-023-02848-5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3262607"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s22197235"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-022-12860-8"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2018.2871266"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2021.3132000"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2020.3041092"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s23042031"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10010095"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/diagnostics13010023"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2014.2330554"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JERM.2020.2995329"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/mop.31639"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s20030840"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MAP.2017.2731199"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2018.2864337"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/iet-map.2013.0054"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/412638"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2018.2849060"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/math11020464"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s11517-022-02694-x"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2020.3040483"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2277562"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2342669"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1038\/srep37620"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2963870"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2018.2876228"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/diagnostics11071232"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JERM.2020.3049071"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2020.3013100"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JERM.2019.2921076"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1002\/bem.22118"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.2528\/PIERC21080404"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/s23020643"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1002\/9781119311997"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1002\/9780470602492"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3295692"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2023.3330294"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2006.03.052"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2006.883453"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1002\/bem.22024"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10870242.pdf?arnumber=10870242","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,19]],"date-time":"2025-02-19T19:03:54Z","timestamp":1739991834000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10870242\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":49,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3538773","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}