{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,26]],"date-time":"2025-02-26T19:40:12Z","timestamp":1740598812353,"version":"3.38.0"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation Project","doi-asserted-by":"publisher","award":["61963036"],"award-info":[{"award-number":["61963036"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100010857","name":"Jiangxi Provincial Department of Education Science and Technology Project","doi-asserted-by":"publisher","award":["GJJ2201719","GJJ211608"],"award-info":[{"award-number":["GJJ2201719","GJJ211608"]}],"id":[{"id":"10.13039\/501100010857","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3539922","type":"journal-article","created":{"date-parts":[[2025,2,7]],"date-time":"2025-02-07T18:43:05Z","timestamp":1738953785000},"page":"33995-34009","source":"Crossref","is-referenced-by-count":0,"title":["Improved Particle Swarm Optimization With Redundant Solution Constraints for Robust Data Reconciliation"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2190-4100","authenticated-orcid":false,"given":"Xiaoshan","family":"Qian","sequence":"first","affiliation":[{"name":"College of Physical Science and Engineering Technology, Yichun University, Yichun, Jiangxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1187-821X","authenticated-orcid":false,"given":"Lisha","family":"Xu","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Hunan Women’s University, Changsha, Hunan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xingli","family":"Cui","sequence":"additional","affiliation":[{"name":"College of Physical Science and Engineering Technology, Yichun University, Yichun, Jiangxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"issue":"6","key":"ref1","first-page":"44","article-title":"Computer control","volume":"57","author":"Kuehn","year":"1961","journal-title":"Chem. Eng. Prog."},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TEC.2004.841521"},{"key":"ref3","first-page":"69","article-title":"Detection and identification of multi-bad data using graph theory","volume":"17","author":"Zhang","year":"1997","journal-title":"Proc.-Chin. Soc. Elect. Eng."},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.neucom.2021.11.044"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.apenergy.2011.03.047"},{"key":"ref6","first-page":"116","article-title":"A sensor fault diagnosis method based on robust auto-associative neural network","volume-title":"Proc. Chin. Soc. Electr. Eng.","volume":"32","author":"Li"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TCSII.2022.3211832"},{"issue":"8","key":"ref8","first-page":"114","article-title":"Data validation of thermodynamic system in power plant based on the partial robust M-regression of splines","volume":"31","author":"Ying","year":"2011","journal-title":"Proc. CSEE"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1080\/00207720050197839"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1016\/S0959-1524(00)00022-6"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.engfailanal.2024.108584"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.3390\/pr12071453"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/j.bspc.2021.102444"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TIM.2021.3063752"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.conengprac.2007.01.003"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/S1004-9541(07)60148-7"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1002\/aic.690421014"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1016\/j.compchemeng.2004.07.019"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1021\/ie0206655"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.3390\/electronics11081263"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/0959-1524(96)00012-1"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.5821\/dissertation-2117-93748"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1155\/2021\/3090537"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1016\/j.applthermaleng.2023.121720"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/JSEN.2023.3344418"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1007\/s12065-021-00661-3"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1021\/acs.iecr.2c02536"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1016\/j.applthermaleng.2017.10.008"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1016\/j.applthermaleng.2021.116611"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/TII.2022.3159583"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.3390\/pr12071414"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1080\/01621459.1974.10482962"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1016\/S0098-1354(01)00721-9"},{"issue":"2","key":"ref34","first-page":"257","article-title":"Optimization algorithm of the nearest neighbor clustering model based on the aic criterion","volume":"27","author":"Qin","year":"2005","journal-title":"Syst. Eng. Electron. Technol."},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/ICNN.1995.488968"},{"doi-asserted-by":"publisher","key":"ref36","DOI":"10.1109\/tvt.2024.3447060"},{"doi-asserted-by":"publisher","key":"ref37","DOI":"10.1109\/tfuzz.2024.3491733"},{"doi-asserted-by":"publisher","key":"ref38","DOI":"10.1108\/RIA-01-2024-0013"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10877837.pdf?arnumber=10877837","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,26]],"date-time":"2025-02-26T19:05:33Z","timestamp":1740596733000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10877837\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3539922","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}