{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,4]],"date-time":"2025-03-04T05:50:52Z","timestamp":1741067452395,"version":"3.38.0"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100003052","name":"Ministry of Trade, Industry and Energy","doi-asserted-by":"publisher","award":["2410004891"],"award-info":[{"award-number":["2410004891"]}],"id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3541923","type":"journal-article","created":{"date-parts":[[2025,2,13]],"date-time":"2025-02-13T18:43:51Z","timestamp":1739472231000},"page":"36388-36400","source":"Crossref","is-referenced-by-count":0,"title":["Complex Permittivity Measurements of Film-Type Materials: Effect of the Waveguide Flange"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8515-971X","authenticated-orcid":false,"given":"Han-Hee","family":"Lee","sequence":"first","affiliation":[{"name":"RF Application Technology Center, Korea Testing Laboratory, Ansan-si, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-3382-8548","authenticated-orcid":false,"given":"Sang","family":"Wook Yoon","sequence":"additional","affiliation":[{"name":"RF Application Technology Center, Korea Testing Laboratory, Ansan-si, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2903-5904","authenticated-orcid":false,"given":"Jae","family":"Wook Lee","sequence":"additional","affiliation":[{"name":"Department of Electronics and Information Engineering, Korea Aerospace University, Goyang-si, South Korea"}]}],"member":"263","reference":[{"volume-title":"Test Methods for Materials for Interconnection Structures\u2014Measurement of Relative Permittivity and Loss Tangent for Copper Clad Laminate at Microwave Frequency Using Split Post Dielectric Resonator","year":"2015","key":"ref1"},{"volume-title":"Relative Permittivity and Loss Tangent Using a Split-Post Dielectric Resonator","year":"2022","key":"ref2"},{"volume-title":"Relative Permittivity and Loss Tangent Using a Split-Cylinder Resonator","year":"2007","key":"ref3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3157398"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/22.795077"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/5.0054904"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tmtt.2023.3278326"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.52520"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2805962"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3013997"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.5515\/KJKIEES.2022.33.6.498"},{"volume-title":"Standard Test Method for Measuring Relative Complex Permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies Using Waveguide","year":"2022","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3156986"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.26866\/jees.2022.6.r.130"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3067224"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2023.3284267"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2020.2999631"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/PowerAfrica57932.2023.10363273"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/EIC49891.2021.9612339"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2011.2175897"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2940723"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2022.3143827"},{"volume-title":"Microwave Engineering","year":"2021","author":"Pozar","key":"ref23"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10884763.pdf?arnumber=10884763","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,3]],"date-time":"2025-03-03T18:39:59Z","timestamp":1741027199000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10884763\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3541923","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}