{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,11]],"date-time":"2026-05-11T11:21:45Z","timestamp":1778498505652,"version":"3.51.4"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003703","name":"Korea Electrotechnology Research Institute (KERI) Primary Research Program through the National Research Council of Science and Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003703","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100014188","name":"Ministry of Science and ICT","doi-asserted-by":"publisher","award":["25A01053"],"award-info":[{"award-number":["25A01053"]}],"id":[{"id":"10.13039\/501100014188","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3546450","type":"journal-article","created":{"date-parts":[[2025,2,27]],"date-time":"2025-02-27T18:52:24Z","timestamp":1740682344000},"page":"39135-39151","source":"Crossref","is-referenced-by-count":4,"title":["A Hybrid Fault Detection Method of Independent Component Analysis and Auto-Associative Kernel Regression for Process Monitoring in Power Plant"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9387-393X","authenticated-orcid":false,"given":"Seunghwan","family":"Jung","sequence":"first","affiliation":[{"name":"Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jonggeun","family":"Kim","sequence":"additional","affiliation":[{"name":"Artificial Intelligence Research Center, Korea Electrotechnology Research Institute, Changwon, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4932-5458","authenticated-orcid":false,"given":"Sungshin","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronics Engineering, Pusan National University, Busan, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1201\/9781420028454"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.pecs.2012.03.001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0961-9534(97)00034-2"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.fuproc.2008.07.012"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2015.06.042"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2013.02.012"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2008.10.014"},{"key":"ref8","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-0347-9","volume-title":"Fault Detection and Diagnosis in Industrial Systems","author":"Chiang","year":"2001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/5.720250"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/0165-1684(94)90029-9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2005.02.005"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2004.03.004"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2024.109218"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jobe.2023.106338"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2017.02.154"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(01)00683-4"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jlp.2015.05.017"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/0967-0661(95)00014-L"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2003.09.004"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2012.06.022"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.buildenv.2022.109010"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.dche.2024.100156"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.117989"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jobe.2024.110402"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.psep.2023.09.010"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2004.05.001"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.engstruct.2010.08.012"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2668986"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/cjce.5450850414"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1021\/ie070381q"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1162\/089976698300017467"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2021.110016"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2018.5902"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/S0893-6080(00)00026-5"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2851-4"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2018.05.004"},{"key":"ref37","doi-asserted-by":"crossref","first-page":"20","DOI":"10.1002\/0471221317","volume-title":"Independent Component Analysis and Blind Source Separation","author":"Hyvarinen","year":"2001"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/72.761722"},{"issue":"4","key":"ref39","first-page":"1406","article-title":"Bagged auto-associative kernel regression-based fault detection and identification approach for steam boilers in thermal power plants","volume":"12","author":"Yu","year":"2017","journal-title":"J. Electr. Eng. Technol."},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1201\/9781315140919"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1201\/b14876"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(95)00076-3"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2004.04.031"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0347-9"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0409-4_8"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2013.04.002"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(94)00057-U"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.016"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2022.107853"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-06173-3"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10906574.pdf?arnumber=10906574","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,13]],"date-time":"2025-05-13T17:47:47Z","timestamp":1747158467000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10906574\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":51,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3546450","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}