{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T17:53:30Z","timestamp":1771955610676,"version":"3.50.1"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52107157"],"award-info":[{"award-number":["52107157"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Scientific Research Project of Educational Department of Liaoning Province","award":["JYTMS202312084"],"award-info":[{"award-number":["JYTMS202312084"]}]},{"DOI":"10.13039\/501100008990","name":"Science and Technology Plan Joint Foundation Project of Liaoning Province","doi-asserted-by":"publisher","award":["2023-MSLH-240"],"award-info":[{"award-number":["2023-MSLH-240"]}],"id":[{"id":"10.13039\/501100008990","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3549034","type":"journal-article","created":{"date-parts":[[2025,3,7]],"date-time":"2025-03-07T18:45:10Z","timestamp":1741373110000},"page":"48096-48105","source":"Crossref","is-referenced-by-count":3,"title":["Monitoring Method for GIS Electrical Contact State Based on VMD-Hilbert Marginal Spectrum Energy Entropy"],"prefix":"10.1109","volume":"13","author":[{"given":"Chen","family":"Cao","sequence":"first","affiliation":[{"name":"College of Electrical Engineering, Shenyang University of Technology, Liaoning, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-2690-7561","authenticated-orcid":false,"given":"Jialin","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Shenyang University of Technology, Liaoning, China"}]},{"given":"Qingli","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Shenyang University of Technology, Liaoning, China"}]},{"given":"Ying","family":"Li","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Shenyang University of Technology, Liaoning, China"}]},{"given":"Zheng","family":"Li","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Shenyang University of Technology, Liaoning, China"}]},{"given":"Jiayu","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Shenyang University of Technology, Liaoning, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/acpee51499.2021.9436830"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/icp.2021.2368"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/en14175507"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/tee.23347"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/hve2.12056"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/app10030944"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2020.107784"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2018.5578"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/tee.21690"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/gtd2.12531"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2019.2914894"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/icp.2024.2497"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMPE.2019.8727324"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijheatmasstransfer.2015.11.069"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106772"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/s19081949"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2893922"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10916653.pdf?arnumber=10916653","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T18:47:55Z","timestamp":1742842075000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10916653\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3549034","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}