{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T02:15:14Z","timestamp":1771467314542,"version":"3.50.1"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100010418","name":"Institute of Information and Communications Technology Planning and Evaluation (IITP) Grant","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100010418","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Korea Government (MSIT)","award":["RS-2023-00225661"],"award-info":[{"award-number":["RS-2023-00225661"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3550378","type":"journal-article","created":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T17:41:52Z","timestamp":1741714912000},"page":"48343-48358","source":"Crossref","is-referenced-by-count":3,"title":["Leveraging Cyberattack News Tweets for Advanced Threat Detection and Classification Using Ensemble of Deep Learning Models With Wolverine Optimization Algorithm"],"prefix":"10.1109","volume":"13","author":[{"given":"Sripada","family":"Nsvsc Ramesh","sequence":"first","affiliation":[{"name":"Department of CSE, Aditya College of Engineering and Technology, Surampalem, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bader Mohammed M.","family":"Al Fardan","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering, College of Engineering, King Khalid University, Abha, Saudi Arabia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C. S. S.","family":"Anupama","sequence":"additional","affiliation":[{"name":"Department of Electronics and Instrumentation Engineering, V. R. Siddhartha Engineering College, Deemed to be University, Vijayawada, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9708-1588","authenticated-orcid":false,"given":"Kollati","family":"Vijaya Kumar","sequence":"additional","affiliation":[{"name":"Department of Computer Science Engineering, GITAM School of Technology, GITAM University, Visakhapatnam, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4527-7447","authenticated-orcid":false,"given":"Seongsoo","family":"Cho","sequence":"additional","affiliation":[{"name":"Department of Convergence Science, Kongju National University, Gongju, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0724-8936","authenticated-orcid":false,"given":"Srijana","family":"Acharya","sequence":"additional","affiliation":[{"name":"Department of Convergence Science, Kongju National University, Gongju, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4862-4790","authenticated-orcid":false,"given":"Cheolhee","family":"Yoon","sequence":"additional","affiliation":[{"name":"Police Autonomous Driving Laboratory, Korean National Police University, Asan, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN52387.2021.9534192"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10207-020-00490-y"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3339252.3342112"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1017\/9781316888513"},{"key":"ref5","first-page":"851","article-title":"Reading the tea leaves: A comparative analysis of threat intelligence","volume-title":"Proc. 28th USENIX Secur. Symp.","author":"Li"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-57878-7_14"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICDE51399.2021.00024"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-41579-2_9"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2020.2987019"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.54216\/JCIM.090205"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2023.103518"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/bxac048"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2023.103579"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.dajour.2023.100364"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.48084\/etasr.8286"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12020298"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2023.119770"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3590777.3590784"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2024.104185"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-74733-6"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2025.104318"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.4236\/jis.2024.154030"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-87454-1"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-77554-9"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-88135-9"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-68342-6"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1080\/0954898x.2024.2443605"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsm.2024.05.002"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/data9030039"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-024-19045-7"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s11540-024-09823-z"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-89826-z"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.oregeorev.2024.106329"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.32604\/cmes.2024.055171"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10921656.pdf?arnumber=10921656","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T18:43:16Z","timestamp":1742841796000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10921656\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3550378","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}