{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T05:41:24Z","timestamp":1771652484528,"version":"3.50.1"},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Coordena\u00e7\u00e3o de Aperfei\u00e7oamento de Pessoal de N\u00edvel Superior - Brasil (CAPES)- Financial Code 001, Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","award":["404054\/2023-4"],"award-info":[{"award-number":["404054\/2023-4"]}]},{"name":"Coordena\u00e7\u00e3o de Aperfei\u00e7oamento de Pessoal de N\u00edvel Superior - Brasil (CAPES)- Financial Code 001, Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","award":["422360\/2023-6"],"award-info":[{"award-number":["422360\/2023-6"]}]},{"DOI":"10.13039\/501100001807","name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado de S\u00e3o Paulo","doi-asserted-by":"crossref","award":["2023\/16053-8"],"award-info":[{"award-number":["2023\/16053-8"]}],"id":[{"id":"10.13039\/501100001807","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100004809","name":"Financiadora de Estudos e Projetos","doi-asserted-by":"crossref","award":["12.0224.00"],"award-info":[{"award-number":["12.0224.00"]}],"id":[{"id":"10.13039\/501100004809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100013383","name":"Instituto Nacional de Ci\u00eancia e Tecnologia - F\u00edsica Nuclear e Aplica\u00e7\u00f5es","doi-asserted-by":"crossref","award":["464898\/2014-5"],"award-info":[{"award-number":["464898\/2014-5"]}],"id":[{"id":"10.13039\/501100013383","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Radiation Facility Network for the Exploration of Effects for Industry and Research (RADNEXT) Project","award":["101008126"],"award-info":[{"award-number":["101008126"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3553758","type":"journal-article","created":{"date-parts":[[2025,3,22]],"date-time":"2025-03-22T00:44:29Z","timestamp":1742604269000},"page":"53885-53894","source":"Crossref","is-referenced-by-count":3,"title":["On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7390-3660","authenticated-orcid":false,"given":"Saulo G.","family":"Alberton","sequence":"first","affiliation":[{"name":"Instituto de Fisica, Universidade de São Paulo, São Paulo, Brazil"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5975-5518","authenticated-orcid":false,"given":"Alexis C. V.","family":"B\u00f4as","sequence":"additional","affiliation":[{"name":"Centro Universitário FEI, São Bernardo do Campo, São Paulo, Brazil"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8277-4012","authenticated-orcid":false,"given":"Jeffery","family":"Wyss","sequence":"additional","affiliation":[{"name":"Dipartimento di Ingegneria Civile e Meccanica, Università degli Studi di Cassino e del Lazio Meridionale, Cassino, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6199-0800","authenticated-orcid":false,"given":"Vitor A. P.","family":"Aguiar","sequence":"additional","affiliation":[{"name":"Instituto de Fisica, Universidade de São Paulo, São Paulo, Brazil"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4141-7166","authenticated-orcid":false,"given":"Matheus S.","family":"Pereira","sequence":"additional","affiliation":[{"name":"Instituto de Fisica, Universidade de São Paulo, São Paulo, Brazil"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0551-242X","authenticated-orcid":false,"given":"Luca","family":"Silvestrin","sequence":"additional","affiliation":[{"name":"Istituto Nazionale di Fisica Nucleare, Sezione di Padova, Padua, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8255-3474","authenticated-orcid":false,"given":"Serena","family":"Mattiazzo","sequence":"additional","affiliation":[{"name":"Istituto Nazionale di Fisica Nucleare, Sezione di Padova, Padua, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6850-4286","authenticated-orcid":false,"given":"Alessandro","family":"Paccagnella","sequence":"additional","affiliation":[{"name":"Dipartimento di Ingegneria dell’Informazione, Università degli Studi di Padova, Padua, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3110-0253","authenticated-orcid":false,"given":"Carlo","family":"Cazzaniga","sequence":"additional","affiliation":[{"name":"ISIS Neutron and Muon Source, Rutherford Appleton Laboratory, Didcot, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1010-2396","authenticated-orcid":false,"given":"Maria","family":"Kastriotou","sequence":"additional","affiliation":[{"name":"ISIS Neutron and Muon Source, Rutherford Appleton Laboratory, Didcot, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3541-6527","authenticated-orcid":false,"given":"Christopher D.","family":"Frost","sequence":"additional","affiliation":[{"name":"ISIS Neutron and Muon Source, Rutherford Appleton Laboratory, Didcot, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0650-6507","authenticated-orcid":false,"given":"Nilberto H.","family":"Medina","sequence":"additional","affiliation":[{"name":"Instituto de Fisica, Universidade de São Paulo, São Paulo, Brazil"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2017.2653239"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2017.2655149"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2024.3497927"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2003.813137"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/23.659062"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2024.3403682"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2252194"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2024.3403570"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/electronics3040582"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2234126"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2256426"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2312948"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2665589"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3175954"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3135369"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3065122"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2023.3267144"},{"key":"ref18","first-page":"1","article-title":"Single-event effects induced by monoenergetic fast neutrons in silicon power UMOSFETs","volume":"2024","author":"Alberton","year":"2024","journal-title":"TechRxiv"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS55911.2022.10412582"},{"key":"ref20","article-title":"Studies on the reliability of power UMOSFETs in the terrestrial radiation environment","volume-title":"Proc. 24th Eur. Conf. Radiat. Effects Compon. Syst. (RADECS)","author":"Alberton"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2018.2879027"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2018.06.016"},{"key":"ref23","article-title":"Measurement and reporting of alpha particle and terrestrial cosmic ray induced soft errors in semiconductor devices","year":"2021"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839134"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3149989"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2449281"},{"key":"ref27","volume-title":"Fundamentals of Power Semiconductor Devices","author":"Baliga","year":"2018"},{"key":"ref28","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4419-5917-1","volume-title":"Advanced Power MOSFET Concepts","author":"Baliga","year":"2010"},{"key":"ref29","article-title":"Test method standard: Test methods for semiconductor devices","year":"2006"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2177863"},{"key":"ref31","doi-asserted-by":"crossref","DOI":"10.1002\/9781118043462","volume-title":"Risk and Safety Analysis of Nuclear Systems","author":"Lee","year":"2011"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2022.114784"},{"key":"ref33","article-title":"EEE-INST-002: Instructions for EEE parts selection, screening, qualification, and derating","author":"Sahu","year":"2003"},{"key":"ref34","article-title":"Test procedure for the measurement of terrestrial cosmic ray induced destructive effects in power semiconductor devices","year":"2022"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839512"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1966.15838"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1985.4334056"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2024.3394452"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910869"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.884971"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2086077"},{"key":"ref42","volume-title":"Hot Carrier Degradation in Semiconductor Devices","author":"Grasser","year":"2014"},{"key":"ref43","volume-title":"Physics of Semiconductor Devices","author":"Sze","year":"2021"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10937224.pdf?arnumber=10937224","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,4]],"date-time":"2025-04-04T05:37:44Z","timestamp":1743745064000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10937224\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":43,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3553758","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}