{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,4]],"date-time":"2026-03-04T16:30:51Z","timestamp":1772641851052,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3564636","type":"journal-article","created":{"date-parts":[[2025,4,28]],"date-time":"2025-04-28T17:34:23Z","timestamp":1745861663000},"page":"75332-75350","source":"Crossref","is-referenced-by-count":1,"title":["Deep Learning-Based Control of Active Power Filters Using LSTM and GRU Networks for Harmonic and Frequency Estimation"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9720-8905","authenticated-orcid":false,"given":"Juan L.","family":"Flores-Garrido","sequence":"first","affiliation":[{"name":"Department of Electrical and Thermal Engineering, University of Huelva, Huelva, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3863-2818","authenticated-orcid":false,"given":"Patricio","family":"Salmer\u00f3n","sequence":"additional","affiliation":[{"name":"Department of Electrical and Thermal Engineering, University of Huelva, Huelva, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1304-8372","authenticated-orcid":false,"given":"Juan A.","family":"G\u00f3mez-Gal\u00e1n","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Computers and Automation, University of Huelva, Huelva, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2299-7732","authenticated-orcid":false,"given":"Alejandro","family":"P\u00e9rez-Vall\u00e9s","sequence":"additional","affiliation":[{"name":"Department of Electrical and Thermal Engineering, University of Huelva, Huelva, Spain"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/9781119307181.ch4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-803216-9.00004-3"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2022.108887"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.17775\/CSEEJPES.2020.02700"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/en10122038"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8070791"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/s22207985"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2023.3258457"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2014.2345741"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2572142"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2515558"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.838513"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2019.102976"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2019.2957734"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.11591\/ijpeds.v8.i2.pp667-676"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2677359"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/access.2018.2878892"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2014.2322580"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/app11167737"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.2993202"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12224652"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2019.1491"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2021.3114127"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2022.3160135"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3077646"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/en15207553"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3077065"},{"key":"ref28","volume-title":"Electromagnetic Compatibility (CEM). Part 4\u201330, Testing and Measurement Techniques-Power Quality Measurement Methods","year":"2015"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3403\/30139621"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/s21082729"},{"key":"ref31","first-page":"1","article-title":"Empirical evaluation of gated recurrent neural networks on sequence modeling","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Chung"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2000.93398"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/10977995.pdf?arnumber=10977995","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,7]],"date-time":"2025-05-07T04:30:56Z","timestamp":1746592256000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10977995\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3564636","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}