{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T17:06:48Z","timestamp":1781284008662,"version":"3.54.1"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3576930","type":"journal-article","created":{"date-parts":[[2025,6,5]],"date-time":"2025-06-05T17:37:51Z","timestamp":1749145071000},"page":"100479-100491","source":"Crossref","is-referenced-by-count":7,"title":["Impact of Parameter Uncertainties on Power Electronic Device Lifetime Predictions"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2567-5544","authenticated-orcid":false,"given":"Faezeh","family":"Kardan","sequence":"first","affiliation":[{"name":"Department of Electrical Sustainable Energy, DC Systems, Energy Conversion, and Storage Group, Delft University of Technology, Delft, CD, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4179-8747","authenticated-orcid":false,"given":"Aditya","family":"Shekhar","sequence":"additional","affiliation":[{"name":"Department of Electrical Sustainable Energy, DC Systems, Energy Conversion, and Storage Group, Delft University of Technology, Delft, CD, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1171-9972","authenticated-orcid":false,"given":"Pavol","family":"Bauer","sequence":"additional","affiliation":[{"name":"Department of Electrical Sustainable Energy, DC Systems, Energy Conversion, and Storage Group, Delft University of Technology, Delft, CD, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3044438"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3055354"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/OJPEL.2020.2973926"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2124436"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2049377"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2007.909236"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.06.069"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2312335"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3274567"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IECON51785.2023.10312731"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2509643"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2356434"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/PEDS.1997.618742"},{"key":"ref14","first-page":"1","article-title":"Model for power cycling lifetime of IGBT Modules\u2013various factors influencing lifetime","volume-title":"Proc. 5th Int. Conf. Integr. Power Electron. Syst.","author":"Bayerer"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2358555"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2360662"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MPEL.2016.2615277"},{"key":"ref18","volume-title":"How To Measure Lifetime for Robustnesss Validation - Step By Step","year":"2012"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3049738"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/0471660280.ch23"},{"key":"ref21","volume-title":"Technical Information IGBT Modules Use of Power Cycling Curves for IGBT 4","year":"2012"},{"key":"ref22","first-page":"810","article-title":"A new lifetime model for advanced power modules with sintered chips and optimized Al wire bonds","author":"Scheuermann","year":"2013","journal-title":"PCIM Eur."},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6348-2"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3083198"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2937050"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2769161"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2018.09.044"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/OJPEL.2024.3458813"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.23919\/EPE23ECCEEurope58414.2023.10264317"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2103329"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2012.2186644"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.3031041"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2977301"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2060459"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2222447"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2222673"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3537165"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3372574"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3494876"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3348832"},{"key":"ref41","first-page":"476","article-title":"Reliability assessment of modular multilevel converters: A comparative study of MIL and mission profile methods","volume-title":"Proc. CIPS","author":"Ahmadi"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1002\/9781119786511.ch14"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.23919\/ICPE2023-ECCEAsia54778.2023.10213916"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/IECON51785.2023.10312649"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1115\/1.4009458"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1115\/1.4010337"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11026042.pdf?arnumber=11026042","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,13]],"date-time":"2025-06-13T17:53:39Z","timestamp":1749837219000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11026042\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":46,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3576930","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}