{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,2]],"date-time":"2025-07-02T04:05:42Z","timestamp":1751429142995,"version":"3.41.0"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3580956","type":"journal-article","created":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T17:40:10Z","timestamp":1750268410000},"page":"109473-109483","source":"Crossref","is-referenced-by-count":0,"title":["Off-Center Rotational Dynamics in Virtual Reality: Effects on Cybersickness and Presence"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-6648-8149","authenticated-orcid":false,"given":"Sion","family":"Cha","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9203-224X","authenticated-orcid":false,"given":"Jonghyeon","family":"Ka","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1077-3716","authenticated-orcid":false,"given":"Imbo","family":"Kong","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Junseok","family":"Ma","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-6823-4040","authenticated-orcid":false,"given":"Sangyeon","family":"Park","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Asan, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0305-5213","authenticated-orcid":false,"given":"Wooksung","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2018.2879065"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.17973\/MMSJ.2015_06_201516"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/GCCE.2017.8229333"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVCG.2017.2653117"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ecns.2019.09.006"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3389\/fpsyg.2019.00158"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/333329.333344"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VR.1999.756957"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0003-6870(00)00059-4"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3389\/frvir.2023.1307925"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.2514\/6.2020-0171"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1152\/jn.2001.85.4.1648"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0136925"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1152\/jn.1998.79.4.2025"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10055-022-00638-2"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1111\/jgs.18553"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3389\/fpsyg.2015.00193"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3758\/s13428-023-02148-8"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3304181.3304216"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-14749-4_21"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVCG.2016.2601607"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3357\/ASEM.2394.2009"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.heliyon.2024.e41035"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1006\/ijhc.1996.0060"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1111\/j.1469-8986.2005.00349.x"},{"issue":"1","key":"ref26","first-page":"15","article-title":"Physiological measures and self-report to evaluate neutral virtual reality worlds","volume-title":"J. CyberTherapy Rehabil.","volume":"4","author":"Busscher","year":"2011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/VR.2002.996519"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-21619-0_61"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0101016"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1089\/109493101300117938"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s10055-020-00466-2"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s10237-020-01343-2"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1207\/s15327108ijap03033"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1177\/0018720811403736"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1162\/105474601300343621"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s10055-019-00407-8"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.chb.2020.106484"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.sbspro.2013.12.027"},{"volume-title":"Introduction to Linear Regression Analysis","year":"2021","author":"Montgomery","key":"ref39"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.2307\/2685478"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-021-89751-x"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.3389\/frvir.2020.587698"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11039776.pdf?arnumber=11039776","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T05:40:10Z","timestamp":1751348410000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11039776\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3580956","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}