{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T07:10:03Z","timestamp":1751094603149,"version":"3.41.0"},"reference-count":73,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea (NRF) grant funded by Korean Government","doi-asserted-by":"publisher","award":["RS-2023-00242528"],"award-info":[{"award-number":["RS-2023-00242528"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3582242","type":"journal-article","created":{"date-parts":[[2025,6,23]],"date-time":"2025-06-23T17:28:39Z","timestamp":1750699719000},"page":"108519-108532","source":"Crossref","is-referenced-by-count":0,"title":["Defect Prediction in CWDM Optical Modules Using Multimodal Learning"],"prefix":"10.1109","volume":"13","author":[{"given":"Kyu-Jeong","family":"Choi","sequence":"first","affiliation":[{"name":"Graduate School of Data Science, Chonnam National University, Gwangju, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jia","family":"Yang","sequence":"additional","affiliation":[{"name":"Graduate School of Data Science, Chonnam National University, Gwangju, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2786-2036","authenticated-orcid":false,"given":"Botambu","family":"Collins","sequence":"additional","affiliation":[{"name":"Graduate School of Data Science, Chonnam National University, Gwangju, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-7226-4898","authenticated-orcid":false,"given":"Sung-Geun","family":"Kim","sequence":"additional","affiliation":[{"name":"Opticis Company Ltd., Seongnam-si, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Do-Jin","family":"Lim","sequence":"additional","affiliation":[{"name":"Opticis Company Ltd., Seongnam-si, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-4811-4138","authenticated-orcid":false,"given":"Jin-Taek","family":"Seong","sequence":"additional","affiliation":[{"name":"Graduate School of Data Science, Chonnam National University, Gwangju, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/icicn62625.2024.10761827"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/lpt.2016.2627534"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/ECTC.2004.1319465"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/jdt.2015.2506783"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.29007\/xwg4"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.3389\/frcmn.2021.756513"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/LPT.2010.2085428"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/jlt.2005.850054"},{"issue":"4","key":"ref9","first-page":"44","article-title":"Jitter\u2014Understanding it, measuring it, eliminating it: Part 1: Jitter fundamentals","volume":"4","author":"Hancock","year":"2004","journal-title":"High Frequency Electron."},{"key":"ref10","article-title":"Simultaneous long-haul gigabit transmission in bidirectional WDM-PON","volume-title":"Proc. SPIE Optics","volume":"9654","author":"Das"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/mcom.2003.1267095"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/icact.2015.7224833"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1063\/1.4915235"},{"issue":"3","key":"ref14","first-page":"2895","article-title":"Analysis of four channel CWDM transceiver modules based on extinction ratio and with the use of EDFA","volume":"5","author":"Hema","year":"2013","journal-title":"Int. J. Eng. Technol. (IJET)"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/eptc.2004.1396711"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/incoset.2012.6513923"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.3390\/app13031363"},{"volume-title":"882E HDMI Protocol Analyzer Generator","year":"2025","key":"ref18"},{"volume-title":"A\/V Quality Testing of Set-Top Boxes and TVs","year":"2024","key":"ref19"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/tpami.2018.2798607"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/msp.2017.2738401"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1145\/3408317"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1145\/2993148.2993176"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1145\/2964284.2967286"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.18653\/v1\/d15-1303"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.18653\/v1\/D17-1115"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.18653\/v1\/p18-1209"},{"key":"ref28","first-page":"12113","article-title":"Deep multimodal multilinear fusion with high-order polynomial pooling","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"32","author":"Hou"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/tgrs.2020.3016820"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/ACII.2017.8273573"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1109\/icra40945.2020.9197266"},{"key":"ref32","first-page":"1","article-title":"Trusted multi-view classification","volume-title":"Proc. Int. Conf. Learn. Represent. (ICLR)","author":"Han"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1016\/j.patrec.2013.07.003"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/ICCV48922.2021.00748"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1145\/3308558.3313691"},{"doi-asserted-by":"publisher","key":"ref36","DOI":"10.1109\/tkde.2008.239"},{"doi-asserted-by":"publisher","key":"ref37","DOI":"10.1007\/978-3-319-46478-7_29"},{"doi-asserted-by":"publisher","key":"ref38","DOI":"10.1007\/978-3-030-01252-6_42"},{"key":"ref39","first-page":"872","article-title":"What is the effect of importance weighting in deep learning","volume-title":"Proc. 36th Int. Conf. Mach. Learn. (ICML)","author":"Byrd"},{"key":"ref40","first-page":"813","article-title":"Concept learning and the problem of small disjuncts","volume-title":"Proc. 11th Int. Joint Conf. Artif. Intell. (IJCAI)","author":"Holte"},{"key":"ref41","article-title":"Survey of resampling techniques for improving classification performance in unbalanced datasets","author":"More","year":"2016","journal-title":"arXiv:1608.06048"},{"doi-asserted-by":"publisher","key":"ref42","DOI":"10.1016\/j.neunet.2018.07.011"},{"doi-asserted-by":"publisher","key":"ref43","DOI":"10.5555\/1642194.1642224"},{"doi-asserted-by":"publisher","key":"ref44","DOI":"10.1109\/tkde.2002.1000348"},{"key":"ref45","first-page":"1","article-title":"Long-tail learning via logit adjustment","volume-title":"Proc. Int. Conf. Learn. Represent. (ICLR)","author":"Menon"},{"doi-asserted-by":"publisher","key":"ref46","DOI":"10.1109\/tsm.2023.3283101"},{"doi-asserted-by":"publisher","key":"ref47","DOI":"10.1109\/access.2021.3074243"},{"doi-asserted-by":"publisher","key":"ref48","DOI":"10.23883\/ijrter.2017.3168.0uwxm"},{"doi-asserted-by":"publisher","key":"ref49","DOI":"10.1609\/aaai.v34i07.7000"},{"key":"ref50","article-title":"Improving neural networks by preventing co-adaptation of feature detectors","author":"Hinton","year":"2012","journal-title":"arXiv:1207.0580"},{"doi-asserted-by":"publisher","key":"ref51","DOI":"10.1016\/s0167-9473(99)00095-x"},{"doi-asserted-by":"publisher","key":"ref52","DOI":"10.1109\/icdar.2003.1227801"},{"key":"ref53","first-page":"7333","article-title":"Modeling tabular data using conditional GAN","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Xu"},{"doi-asserted-by":"publisher","key":"ref54","DOI":"10.1109\/cvpr.2016.90"},{"doi-asserted-by":"publisher","key":"ref55","DOI":"10.1016\/j.cie.2024.110074"},{"doi-asserted-by":"publisher","key":"ref56","DOI":"10.1007\/bf00994018"},{"doi-asserted-by":"publisher","key":"ref57","DOI":"10.1023\/a:1010933404324"},{"doi-asserted-by":"publisher","key":"ref58","DOI":"10.1109\/tit.1967.1053964"},{"doi-asserted-by":"publisher","key":"ref59","DOI":"10.1111\/j.2517-6161.1958.tb00292.x"},{"doi-asserted-by":"publisher","key":"ref60","DOI":"10.1214\/aos\/1013203451"},{"volume-title":"Pattern Classification and Scene Analysis","year":"1973","author":"Duda","key":"ref61"},{"volume-title":"Classification and Regression Trees","year":"1984","author":"Breiman","key":"ref62"},{"doi-asserted-by":"publisher","key":"ref63","DOI":"10.1006\/jcss.1997.1504"},{"doi-asserted-by":"publisher","key":"ref64","DOI":"10.1145\/2939672.2939785"},{"key":"ref65","first-page":"3146","article-title":"LightGBM: A highly efficient gradient boosting decision tree","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Ke"},{"key":"ref66","first-page":"6639","article-title":"CatBoost: Unbiased boosting with categorical features","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"31","author":"Prokhorenkova"},{"doi-asserted-by":"publisher","key":"ref67","DOI":"10.1016\/s0169-7439(97)00061-0"},{"doi-asserted-by":"publisher","key":"ref68","DOI":"10.1109\/cvpr52688.2022.02005"},{"key":"ref69","first-page":"2902","article-title":"Addressing failure prediction by learning model confidence","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Corbi\u00e8re"},{"doi-asserted-by":"publisher","key":"ref70","DOI":"10.1016\/j.engappai.2023.106359"},{"doi-asserted-by":"publisher","key":"ref71","DOI":"10.1109\/tsm.2020.2964581"},{"doi-asserted-by":"publisher","key":"ref72","DOI":"10.3390\/machines10020146"},{"key":"ref73","article-title":"DeepInspect: An AI-powered defect detection for manufacturing industries","author":"Kumbhar","year":"2023","journal-title":"arXiv:2311.03725"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11048609.pdf?arnumber=11048609","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:32:30Z","timestamp":1751092350000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11048609\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":73,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3582242","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}