{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T14:51:25Z","timestamp":1779202285833,"version":"3.51.4"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Coordination for the Improvement of Higher Education Personnel-Brazil","award":["001"],"award-info":[{"award-number":["001"]}]},{"name":"Brazilian National Council for Scientific and Technological Development","award":["445374\/2020-9"],"award-info":[{"award-number":["445374\/2020-9"]}]},{"name":"Brazilian National Council for Scientific and Technological Development","award":["406453\/2021-7"],"award-info":[{"award-number":["406453\/2021-7"]}]},{"name":"Brazilian National Council for Scientific and Technological Development","award":["140235\/2021-3"],"award-info":[{"award-number":["140235\/2021-3"]}]},{"name":"Brazilian National Council for Scientific and Technological Development","award":["402334\/2023-0"],"award-info":[{"award-number":["402334\/2023-0"]}]},{"name":"Brazilian National Council for Scientific and Technological Development","award":["308979\/2022-2"],"award-info":[{"award-number":["308979\/2022-2"]}]},{"DOI":"10.13039\/501100001807","name":"S\u00e3o Paulo Research Foundation","doi-asserted-by":"crossref","award":["2020\/06935-5"],"award-info":[{"award-number":["2020\/06935-5"]}],"id":[{"id":"10.13039\/501100001807","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001807","name":"S\u00e3o Paulo Research Foundation","doi-asserted-by":"crossref","award":["2024\/18735-1"],"award-info":[{"award-number":["2024\/18735-1"]}],"id":[{"id":"10.13039\/501100001807","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3582359","type":"journal-article","created":{"date-parts":[[2025,6,23]],"date-time":"2025-06-23T17:28:39Z","timestamp":1750699719000},"page":"108466-108480","source":"Crossref","is-referenced-by-count":2,"title":["High Impedance Fault Location in Distribution Systems: A Novel Approach With Enhanced Metrics and Intelligent Algorithms"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3540-6401","authenticated-orcid":false,"given":"Gabriela","family":"Nunes Lopes","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, School of Engineering, Federal University of Minas Gerais, Belo Horizonte, Minas Gerais, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9344-3796","authenticated-orcid":false,"given":"Pedro I. N.","family":"Barbalho","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, São Carlos School of Engineering, University of São Paulo, São Carlos, São Paulo, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0732-9453","authenticated-orcid":false,"given":"Jos\u00e9","family":"Carlos Melo Vieira","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, São Carlos School of Engineering, University of São Paulo, São Carlos, São Paulo, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6581-3470","authenticated-orcid":false,"given":"Denis V.","family":"Coury","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, São Carlos School of Engineering, University of São Paulo, São Carlos, São Paulo, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2022.108892"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/OAJPE.2023.3244341"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2874879"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2019.2926668"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PEOCO.2012.6230888"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PowerAfrica.2018.8520972"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-022-01658-6"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/NAPS.2014.6965403"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CISTEM.2018.8613583"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2548942"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2018.8378825"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2190819"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106577"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.01.030"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.11.018"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106576"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2014.2365855"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TLA.2016.7437220"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2015.7232740"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2507541"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2020.105910"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2019.02.012"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2018.03.008"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/eng2.12556"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2024.110291"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2023.109912"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2024.111147"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2024.110403"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2022.3199781"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2022.3216731"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3412991"},{"key":"ref32","volume-title":"IEEE 34 Node Test Feeder","year":"2010"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2816400"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3285975"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2015.0407"},{"issue":"1","key":"ref36","first-page":"30","article-title":"Numerical model framework of power quality events","volume":"43","author":"Tan","year":"2010","journal-title":"Eur. J. Sci. Res."},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.107681"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/78.492555"},{"key":"ref39","volume-title":"Statistics","author":"Witte","year":"2007"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-011-0218-2"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.segan.2022.100606"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-7138-7"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/APSIT58554.2023.10201799"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.3390\/s22030945"},{"key":"ref45","volume-title":"MATLAB","year":"2023"},{"key":"ref46","volume-title":"Electrical Power Systems Quality","author":"Dugan","year":"2003"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11048546.pdf?arnumber=11048546","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:32:26Z","timestamp":1751092346000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11048546\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":46,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3582359","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}