{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T19:07:13Z","timestamp":1754161633486,"version":"3.41.2"},"reference-count":14,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3585636","type":"journal-article","created":{"date-parts":[[2025,7,3]],"date-time":"2025-07-03T13:29:56Z","timestamp":1751549396000},"page":"119831-119841","source":"Crossref","is-referenced-by-count":0,"title":["A Layout-Based Method for Analog Fault Injection in the Context of Functional Safety"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-4952-7591","authenticated-orcid":false,"given":"Raffi","family":"Der Yeghiayan","sequence":"first","affiliation":[{"name":"STMicroelectronics, Cornaredo, Italy"}]},{"given":"Paolo","family":"Vilmercati","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Cornaredo, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8182-7891","authenticated-orcid":false,"given":"Giancarlo","family":"Storti Gajani","sequence":"additional","affiliation":[{"name":"Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB), Politecnico di Milano, Milan, Italy"}]},{"given":"Gianluca","family":"D\u2019Alesio","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Cornaredo, Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000141"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3298698"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805869"},{"key":"ref4","first-page":"301","article-title":"Fast time-domain simulation for reliable fault detection","volume-title":"Proc. Design, Autom. Test Eur. Conf. Exhib. (DATE)","author":"Tasic"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2013.6549811"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131581"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2210852"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699229"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.855884"},{"volume-title":"Road Vehicles\u2013Functional Safety\u2013Part 5: Product Development at the Hardware Level","year":"2018","key":"ref10"},{"volume-title":"Road Vehicles\u2013Functional Safety","year":"2018","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.371590"},{"volume-title":"IEEE Draft Standard for Analog Defect Modeling and Coverage","year":"2024","key":"ref13"},{"volume-title":"Spectre Fault Analysis Application Note","year":"2023","key":"ref14"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11071309.pdf?arnumber=11071309","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,29]],"date-time":"2025-07-29T05:00:53Z","timestamp":1753765253000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11071309\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3585636","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}