{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T07:50:47Z","timestamp":1769845847661,"version":"3.49.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Research Resurgence under the Glocal University 30 Project"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3591488","type":"journal-article","created":{"date-parts":[[2025,7,22]],"date-time":"2025-07-22T18:06:50Z","timestamp":1753207610000},"page":"130603-130609","source":"Crossref","is-referenced-by-count":1,"title":["Soft Error in Saddle Fin-Based DRAM at Cryogenic Temperature"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-5117-210X","authenticated-orcid":false,"given":"Minsang","family":"Ryu","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-9256-4627","authenticated-orcid":false,"given":"Minki","family":"Suh","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7830-9321","authenticated-orcid":false,"given":"Jonghyeon","family":"Ha","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-3198-6743","authenticated-orcid":false,"given":"Minji","family":"Bang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-7408-978X","authenticated-orcid":false,"given":"Dabok","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3031-0715","authenticated-orcid":false,"given":"Hojoon","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Reliability Technology Research and Development, Korea Automotive Technology Institute (KATECH), Cheonan, Chungnam, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-0236-6698","authenticated-orcid":false,"given":"Hyunchul","family":"Sagong","sequence":"additional","affiliation":[{"name":"Department of Reliability Technology Research and Development, Korea Automotive Technology Institute (KATECH), Cheonan, Chungnam, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3113-4549","authenticated-orcid":false,"given":"Dong-Seok","family":"Kim","sequence":"additional","affiliation":[{"name":"KOMAC, Korea Atomic Energy Research Institute, Gyeongju-si, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7798-3381","authenticated-orcid":false,"given":"Jungsik","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2021.3068186"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/irps.2017.7936404"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2016.2551733"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2019.2956293"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2006.886210"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2015.2508981"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1143\/jjap.45.3256"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2017.2779831"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2005.853449"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1142\/s0129156404002363"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/rams.2011.5754515"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3132402.3132436"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/imw.2018.8388826"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/16.622611"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.1990.237157"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/t-ed.1982.20697"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(92)90184-e"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/16.121690"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/led.2019.2897685"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2022.3207113"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2003.813129"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.1663501"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2009.2022267"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3206401"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2007.894298"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11088077.pdf?arnumber=11088077","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,29]],"date-time":"2025-07-29T05:13:48Z","timestamp":1753766028000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11088077\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3591488","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}