{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T03:21:53Z","timestamp":1776482513467,"version":"3.51.2"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Innovation Training Program for Undergraduates at Hohai University","award":["X202510294513"],"award-info":[{"award-number":["X202510294513"]}]},{"name":"Innovation Training Program for Undergraduates at Hohai University","award":["X202510294520"],"award-info":[{"award-number":["X202510294520"]}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["B250201031"],"award-info":[{"award-number":["B250201031"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3594903","type":"journal-article","created":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T18:15:48Z","timestamp":1754072148000},"page":"141079-141089","source":"Crossref","is-referenced-by-count":1,"title":["Small Target Detection for Power Line Components in Complex UAV Imagery"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-2885-1888","authenticated-orcid":false,"given":"Zhiyuan","family":"Sun","sequence":"first","affiliation":[{"name":"College of Electrical and Power Engineering, Hohai University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2058-1610","authenticated-orcid":false,"given":"Xu","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electrical and Power Engineering, Hohai University, Nanjing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.005867"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2023.04.078"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2023.107327"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC58415.2024.10919563"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC57777.2023.10421958"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2022.10.435"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/rs15010083"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/en14051426"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3367294"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3396134"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/agriculture15010022"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1111\/jfpe.13866"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2209.02976"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.00721"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1512.02325"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCA.2018.8444172"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISISE.2012.93"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CCDC.2018.8407558"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/3532213.3532300"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/rs14205153"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1155\/2024\/5977332"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/rs14205176"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12214537"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10070771"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW50498.2020.00203"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfp.2024.100397"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2021.3135006"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.4081\/jae.2023.1549"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-023-04628-y"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111001"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-26409-2_27"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01157"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-99-7962-2_39"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3577843"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3554906"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1093\/tse\/tdac036"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2024.3507536"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-44195-0_14"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11106457.pdf?arnumber=11106457","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,18]],"date-time":"2025-08-18T19:46:14Z","timestamp":1755546374000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11106457\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3594903","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}