{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T00:17:16Z","timestamp":1780359436137,"version":"3.54.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100016238","name":"Ministerie van Economische Zaken en Klimaat","doi-asserted-by":"publisher","award":["AI211006"],"award-info":[{"award-number":["AI211006"]}],"id":[{"id":"10.13039\/501100016238","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002347","name":"Bundesministerium f?r Bildung und Forschung","doi-asserted-by":"publisher","award":["01IS21022G"],"award-info":[{"award-number":["01IS21022G"]}],"id":[{"id":"10.13039\/501100002347","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3595430","type":"journal-article","created":{"date-parts":[[2025,8,4]],"date-time":"2025-08-04T18:46:18Z","timestamp":1754333178000},"page":"137291-137302","source":"Crossref","is-referenced-by-count":1,"title":["Calibration of Electron Microscopes Through Deep Learning and Bayesian Optimization"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-3224-598X","authenticated-orcid":false,"given":"Jilles S. van","family":"Hulst","sequence":"first","affiliation":[{"name":"Department of Mechanical Engineering, Control Systems Technology Section, Eindhoven University of Technology, Eindhoven, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-1075-7903","authenticated-orcid":false,"given":"Roy A. C.","family":"van Zuijlen","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, Control Systems Technology Section, Eindhoven University of Technology, Eindhoven, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-3840-5312","authenticated-orcid":false,"given":"Narges","family":"Javaheri","sequence":"additional","affiliation":[{"name":"Thermo Fisher Scientific, Eindhoven, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maurits","family":"Diephuis","sequence":"additional","affiliation":[{"name":"Thermo Fisher Scientific, Eindhoven, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3047-9334","authenticated-orcid":false,"given":"Duarte J.","family":"Antunes","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, Control Systems Technology Section, Eindhoven University of Technology, Eindhoven, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3440-8007","authenticated-orcid":false,"given":"W. P. M. H.","family":"Heemels","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, Control Systems Technology Section, Eindhoven University of Technology, Eindhoven, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1697554"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1201\/9781420045550"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1201\/9781003063056-8"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2017.03.020"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-49762-4"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-7200-2_1"},{"issue":"3","key":"ref7","doi-asserted-by":"crossref","first-page":"12","DOI":"10.1017\/S1551929519000427","article-title":"Introduction to the ronchigram and its calculation with Ronchigram.Com","volume":"27","author":"Schnitzer","year":"2019","journal-title":"Microsc. Today"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/sca.4950190805"},{"key":"ref9","first-page":"788","article-title":"Towards automatic control of scanning transmission electron microscopes","volume-title":"Proc. IEEE Int. Conf. Control Appl.","author":"Tejada"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref11","doi-asserted-by":"crossref","DOI":"10.1017\/9781108348973","volume-title":"Bayesian Optimization","author":"Garnett","year":"2023"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"115","DOI":"10.1016\/j.ultramic.2012.03.004","article-title":"Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy","volume":"116","author":"Vulovi\u0107","year":"2012","journal-title":"Ultramicroscopy"},{"key":"ref13","article-title":"Automated focusing and astigmatism correction in electron microscopy","author":"Rudnaya","year":"2011"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2011.01.034"},{"key":"ref15","volume-title":"STEM Aberration Correctors\u2014DCOR\/ASCOR","year":"2025"},{"key":"ref16","volume-title":"Sherpa User Manual","year":"2019"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2022.113663"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-024-45042-3"},{"issue":"5","key":"ref19","doi-asserted-by":"crossref","first-page":"921","DOI":"10.1017\/S1431927620001841","article-title":"Optimal STEM convergence angle selection using a convolutional neural network and the strehl ratio","volume":"26","author":"Schnitzer","year":"2020","journal-title":"Microsc. Microanalysis"},{"key":"ref20","first-page":"94","article-title":"Bayesian optimization applied to calibration of electron microscope","volume-title":"Proc. Benelux Meeting Syst. Control","author":"van Hulst"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2025.114137"},{"key":"ref22","article-title":"BEACON - automated aberration correction for scanning transmission electron microscopy using Bayesian optimization","author":"Pattison","year":"2024","journal-title":"arXiv:2410.14873"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1063\/1.5009683"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/bf01349606"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/504729.504754"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2021.08.159"},{"key":"ref27","volume-title":"Gaussian Processes for Machine Learning","author":"Rasmussen","year":"2006"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2019.112821"},{"key":"ref29","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4419-7200-2","volume-title":"Scanning Transmission Electron Microscopy","author":"Pennycook","year":"2011"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11107396.pdf?arnumber=11107396","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,11]],"date-time":"2025-08-11T17:44:35Z","timestamp":1754934275000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11107396\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3595430","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}