{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,15]],"date-time":"2025-08-15T02:42:42Z","timestamp":1755225762085,"version":"3.43.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3596287","type":"journal-article","created":{"date-parts":[[2025,8,6]],"date-time":"2025-08-06T18:01:44Z","timestamp":1754503304000},"page":"138900-138913","source":"Crossref","is-referenced-by-count":0,"title":["Quantitative Analysis of Operator Influence on IEC 61000-4-2 Indirect ESD Testing and Recommendations for Enhanced Reproducibility"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5988-9583","authenticated-orcid":false,"given":"Panagiotis K.","family":"Papastamatis","sequence":"first","affiliation":[{"name":"School of Electrical and Computer Engineering, National Technical University of Athens, Athens, Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4071-5185","authenticated-orcid":false,"given":"Eleni P.","family":"Nicolopoulou","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, National Technical University of Athens, Athens, Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-7446-4936","authenticated-orcid":false,"given":"Christos A.","family":"Christodoulou","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, National Technical University of Athens, Athens, Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6743-4784","authenticated-orcid":false,"given":"Ioannis F.","family":"Gonos","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, National Technical University of Athens, Athens, Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume-title":"EMC-Part 4-2: Testing and Measurement Techniques-Electrostatic Discharge Immunity Test","year":"2008","key":"ref1"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/temc.2020.2986971"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/temc.2022.3220651"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/access.2017.2782088"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/access.2023.3325487"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/access.2025.3569288"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/emceurope57790.2023.10274328"},{"key":"ref8","first-page":"1","article-title":"Reproducibility analysis during ESD testing of a SpaceWire link simulator","volume-title":"Proc. Int. Conf. Electr. Eng. Inf. Techn.","author":"Papastamatis"},{"key":"ref9","first-page":"1","article-title":"HMM round Robin study: What to expect when testing components to the IEC 61000-4-2 waveform","volume-title":"Proc. Electr. Overstress\/Electrostatic Discharge Symp.","author":"Muhonen"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/ceem.2009.5304394"},{"volume-title":"EMC-Part 4-2: Testing and Measurement Techniques-Electrostatic Discharge Immunity Test","year":"2025","key":"ref11"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/emceurope59828.2024.10722155"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/apemc.2017.7975441"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.23919\/emcjapan\/apemcokinaw58965.2024.10584971"},{"volume-title":"Proc. 25th EEEIC Int. Conf. Environ. Elect. Eng.","author":"Papastamatis","article-title":"Quantitative assessment of human operator influence in IEC 61000-4-2 ESD testing","key":"ref15"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/temc.2025.3560614"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/temc.2020.2984338"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/temc.2023.3257240"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/isemc.2017.8077944"},{"volume-title":"Electrostatic Discharge (ESD) Sensitivity Testing\u2014Human Body Model (HBM)\u2014Component Level","year":"2024","key":"ref20"},{"volume-title":"ECSS-E-ST-50-12C Rev.1\u2014SpaceWire\u2014Links, Nodes, Routers and Networks","year":"2019","key":"ref21"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.3403\/30288202"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.4018\/978-1-7998-4879-0.ch008"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/cscc55931.2022.00050"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/emc\/si\/pi\/emceurope52599.2021.9559301"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/isemc.2017.8077859"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.3390\/electronics10060728"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1201\/b18362"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1007\/s00421-011-2264-x"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1016\/j.apergo.2021.103464"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11115021.pdf?arnumber=11115021","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,13]],"date-time":"2025-08-13T17:35:50Z","timestamp":1755106550000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11115021\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3596287","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}