{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T18:43:14Z","timestamp":1755801794912,"version":"3.44.0"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62204011"],"award-info":[{"award-number":["62204011"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3598275","type":"journal-article","created":{"date-parts":[[2025,8,13]],"date-time":"2025-08-13T17:35:26Z","timestamp":1755106526000},"page":"143102-143109","source":"Crossref","is-referenced-by-count":0,"title":["An Improved SiC MOSFET With Integrated Schottky Contact Super Barrier Rectifier"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9926-947X","authenticated-orcid":false,"given":"Xintian","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinglong","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8709-297X","authenticated-orcid":false,"given":"Yun","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dongqing","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5847-946X","authenticated-orcid":false,"given":"Yu","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yunpeng","family":"Jia","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0747-7998","authenticated-orcid":false,"given":"Bodian","family":"Li","sequence":"additional","affiliation":[{"name":"Network Science Institute, Northeastern University, Boston, MA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuanfu","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2013.2268900"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-47314-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/led.2007.897861"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ispsd.2019.8757567"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/ispsd.2017.7988890"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/pedg.2015.7223083"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/63.704135"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ispsd.2019.8757664"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ispsd.2015.7123440"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2011.6131620"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.11.033"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/led.2018.2881234"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/16.52458"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jeds.2020.3001211"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/led.2020.3017650"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/led.2017.2703597"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2007.912752"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2023.3315680"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2019.2931078"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/led.2016.2542183"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.1784520"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"461","DOI":"10.4028\/www.scientific.net\/MSF.778-780.461","article-title":"Performance and ruggedness of 1200 V SiC\u2014trench\u2014MOSFET","volume":"778","author":"Niwa","year":"2014","journal-title":"Mater. Sci. Forum"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2019.2944944"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2730259"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/led.2016.2609599"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2017.2755721"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-11125-9"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.23919\/ispsd.2017.7988904"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/16.944212"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11123859.pdf?arnumber=11123859","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T18:43:29Z","timestamp":1755715409000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11123859\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3598275","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}