{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,3]],"date-time":"2026-04-03T13:25:12Z","timestamp":1775222712320,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3616252","type":"journal-article","created":{"date-parts":[[2025,9,30]],"date-time":"2025-09-30T17:39:47Z","timestamp":1759253987000},"page":"171889-171901","source":"Crossref","is-referenced-by-count":0,"title":["Quantitative Analysis of Reliability and Cost Function of 15-Level Inverter"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-5170-4529","authenticated-orcid":false,"given":"N.","family":"Subramanian","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Vellore Institute of Technology, Vellore, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3572-2885","authenticated-orcid":false,"given":"Albert Alexander","family":"Stonier","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Vellore Institute of Technology, Vellore, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.11591\/ijeecs.v20.i2.pp654-661"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s13369-022-06992-2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/access.2024.3363832"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2016.2627019"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2016.2569059"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2013.2297300"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ifeec.2015.7361605"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2010.2049377"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/isie.2017.8001316"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/piecon56912.2023.10085872"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1142\/s0218126623501815"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2017.2682105"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2023.3253776"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2012.2222856"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/iecon.2003.1280259"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3193790"},{"key":"ref17","first-page":"1460","article-title":"Reliability analysis of a novel fault tolerant multilevel inverter topology","volume-title":"Proc. 44th Annu. Conf. IEEE Ind. Electron. Soc.","author":"Gautam"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2020.0913"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2018.5452"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/cta.3653"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/mi14112045"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2013.0365"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2017.11.021"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s12633-021-01362-3"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ojpel.2021.3075061"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2015.0720"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/iecon.2016.7793762"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/2050-7038.12458"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ETECHNXT.2018.8385334"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2176691"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2282606"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1049\/pel2.12843"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3348832"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/0951-8320(93)90005-j"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2023.3302869"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1002\/cta.4312"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1002\/cta.3946"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11184785.pdf?arnumber=11184785","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,8]],"date-time":"2025-10-08T17:39:16Z","timestamp":1759945156000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11184785\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3616252","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}