{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,6]],"date-time":"2026-07-06T23:11:53Z","timestamp":1783379513270,"version":"3.54.6"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung Electronics Company Ltd.","doi-asserted-by":"crossref","award":["IO240313-09299-01"],"award-info":[{"award-number":["IO240313-09299-01"]}],"id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3622595","type":"journal-article","created":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T17:42:01Z","timestamp":1760722921000},"page":"180264-180275","source":"Crossref","is-referenced-by-count":2,"title":["A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3718-4352","authenticated-orcid":false,"given":"Jongho","family":"Park","sequence":"first","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sangjun","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-2040-8889","authenticated-orcid":false,"given":"Jaehyun","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hanseong","family":"Cho","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-4230-925X","authenticated-orcid":false,"given":"Nayeun","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7093-2095","authenticated-orcid":false,"given":"Sungho","family":"Kang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126621502546"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.1013898"},{"key":"ref3","volume-title":"TestMAX DFT User Guide","year":"2025"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2597214"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2617160"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.238041"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2606248"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3105429"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS48691.2020.9107584"},{"key":"ref10","first-page":"253","article-title":"Test point insertion for scan based BIST","volume-title":"Proc. European. Test. Conf. (ETC)","volume":"1991","author":"Seiss"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557122"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3147100"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/43.918212"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831593"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437611"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894198"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197634"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.833617"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2428697"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2925353"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3100741"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DFT52944.2021.9568357"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/VTS56346.2023.10139967"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1023\/A:1014993509806"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3233737"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1155\/2010\/670476"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923416"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2008.30"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2010.11.004"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2019.04.001"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386971"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.11591\/eei.v12i6.5668"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11206136.pdf?arnumber=11206136","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,24]],"date-time":"2025-10-24T04:53:11Z","timestamp":1761281591000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11206136\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3622595","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}