{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T07:09:06Z","timestamp":1776150546403,"version":"3.50.1"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100000266","name":"Engineering and Physical Sciences Research Council","doi-asserted-by":"publisher","award":["EP\/T00097X\/1"],"award-info":[{"award-number":["EP\/T00097X\/1"]}],"id":[{"id":"10.13039\/501100000266","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100000266","name":"Engineering and Physical Sciences Research Council","doi-asserted-by":"publisher","award":["EP\/Z533166\/1"],"award-info":[{"award-number":["EP\/Z533166\/1"]}],"id":[{"id":"10.13039\/501100000266","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3628792","type":"journal-article","created":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T18:37:10Z","timestamp":1762281430000},"page":"195295-195306","source":"Crossref","is-referenced-by-count":1,"title":["TM-UNet: A Deep Learning Approach for High-Resolution, Bend-Resilient Single-Fiber Imaging"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1925-4065","authenticated-orcid":false,"given":"Abdullah","family":"Abdulaziz","sequence":"first","affiliation":[{"name":"School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4775-4208","authenticated-orcid":false,"given":"Simon","family":"Peter Mehkail","sequence":"additional","affiliation":[{"name":"School of Physics and Astronomy, University of Glasgow, Glasgow, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao-Wei","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Physics and Astronomy, University of Glasgow, Glasgow, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3177-9884","authenticated-orcid":false,"given":"Yoann","family":"Altmann","sequence":"additional","affiliation":[{"name":"School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6643-0618","authenticated-orcid":false,"given":"Miles J.","family":"Padgett","sequence":"additional","affiliation":[{"name":"School of Physics and Astronomy, University of Glasgow, Glasgow, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9558-8294","authenticated-orcid":false,"given":"Stephen","family":"McLaughlin","sequence":"additional","affiliation":[{"name":"School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1364\/OPN.27.1.000024"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1126\/science.abl3771"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/OE.19.018871"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms2024"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1039\/C1LC20719A"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2015.112"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1364\/OE.23.023845"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/OL.41.000497"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/s41377-018-0094-x"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.001656"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.104.100601"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.000096"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/OL.43.000419"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/s41377-021-00514-9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.001656"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/s41377-018-0111-0"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.012881"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.022504"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1364\/OE.23.026905"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevX.9.041050"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-021-23729-1"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/OE.387648"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/OE.481052"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-023-38480-4"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1038\/s41566-023-01240-x"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1103\/physrevlett.120.233901"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/lpor.202000553"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/1555-6611\/adcd47"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3088914"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref32","volume-title":"Deepinverse: A Deep Learning Framework for Inverse Problems in Imaging","author":"Tachella","year":"2024"},{"key":"ref33","first-page":"1","article-title":"Adam: A method for stochastic optimization","volume-title":"Proc. Int. Conf. Learn. Represent. (ICLR)","author":"Kingma"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11224757.pdf?arnumber=11224757","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T05:37:01Z","timestamp":1763703421000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11224757\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3628792","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}