{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,15]],"date-time":"2026-07-15T17:23:51Z","timestamp":1784136231300,"version":"3.55.0"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3637545","type":"journal-article","created":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T19:05:14Z","timestamp":1764183914000},"page":"207566-207580","source":"Crossref","is-referenced-by-count":3,"title":["Cost-Stability Evaluation Framework for Reliable Deployment of Object Detectors in Industrial Applications"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-4029-0238","authenticated-orcid":false,"given":"Kuhyun","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon-si, Gyeonggi-do, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6662-5159","authenticated-orcid":false,"given":"Jihoon","family":"Hong","sequence":"additional","affiliation":[{"name":"Memory Division, Samsung Electronics Company Ltd., Hwaseong-si, Gyeonggi-do, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-9722-4880","authenticated-orcid":false,"given":"Beom-Seok","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering, Sungkyunkwan University, Suwon-si, Gyeonggi-do, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-6760-3332","authenticated-orcid":false,"given":"Yuna","family":"Song","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering, Sungkyunkwan University, Suwon-si, Gyeonggi-do, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8549-8992","authenticated-orcid":false,"given":"Dong-Hee","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Systems Management Engineering, Sungkyunkwan University, Suwon-si, Gyeonggi-do, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr52729.2023.01088"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s21134350"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3606367"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52734.2025.00777"},{"key":"ref5","article-title":"Can you trust your model\u2019s uncertainty? Evaluating predictive uncertainty under dataset shift","author":"Ovadia","year":"2019","journal-title":"arXiv:1906.02530"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/iwssip48289.2020.9145130"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/iccas50221.2020.9268228"},{"key":"ref8","article-title":"Information retrieval","volume-title":"Butterworths","author":"van Rijsbergen","year":"1979"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ccwc54503.2022.9720869"},{"key":"ref10","article-title":"Style augmentation: Data augmentation via style randomization","author":"Jackson","year":"2018","journal-title":"arXiv:1809.05375"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01635"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-022-25859-y"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-59077-5"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-64340-9_21"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3138407"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/5133543"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/f15111910"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.18494\/SAM5648"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/igarss39084.2020.9324137"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-009-0275-4"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2016.2577031"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-72751-1_1"},{"key":"ref23","article-title":"NMS strikes back","author":"Zhang","year":"2022","journal-title":"arXiv:2212.06137"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2017.351"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/bioengineering10070807"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-67389-9_44"},{"key":"ref27","article-title":"Identification of primary angle-closure on AS-OCT images with convolutional neural networks","author":"Yuan","year":"2019","journal-title":"arXiv:1910.10414"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/iccv.2019.00894"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11269773.pdf?arnumber=11269773","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T10:35:32Z","timestamp":1766054132000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11269773\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3637545","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}