{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T18:53:33Z","timestamp":1766602413303,"version":"3.48.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100004735","name":"Natural Science Foundation of Hunan Province","doi-asserted-by":"publisher","award":["2025JJ70159"],"award-info":[{"award-number":["2025JJ70159"]}],"id":[{"id":"10.13039\/501100004735","id-type":"DOI","asserted-by":"publisher"}]},{"name":"State Key Laboratory of Nuclear Reactor Systems Design for Open Projects","award":["SQ-KFKT-24-2021-006"],"award-info":[{"award-number":["SQ-KFKT-24-2021-006"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U2267206"],"award-info":[{"award-number":["U2267206"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Testing of Fission Product Source Term Calculation Software and Related Items","award":["VVKJ-05-FW-HT-20220006-IDR2-001"],"award-info":[{"award-number":["VVKJ-05-FW-HT-20220006-IDR2-001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3644032","type":"journal-article","created":{"date-parts":[[2025,12,15]],"date-time":"2025-12-15T18:39:31Z","timestamp":1765823971000},"page":"213273-213284","source":"Crossref","is-referenced-by-count":0,"title":["Counterfactual Inference for Early Parametric Drift Fault Diagnosis in Analog Circuits"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-8741-0624","authenticated-orcid":false,"given":"Jia","family":"Yang","sequence":"first","affiliation":[{"name":"School of Computer Science, University of South China, Hengyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shuaixing","family":"He","sequence":"additional","affiliation":[{"name":"Hangzhou Xiangting Technology Company Ltd., Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1970-8347","authenticated-orcid":false,"given":"Jie","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Computer Science, University of South China, Hengyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yunhua","family":"Wang","sequence":"additional","affiliation":[{"name":"Hengyang Ramon Science and Technology Company Ltd., Hengyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5820-9080","authenticated-orcid":false,"given":"Zhi","family":"Chen","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Nuclear Reactor Technology, Nuclear Power Institute of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhiguang","family":"Deng","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Nuclear Reactor Technology, Nuclear Power Institute of China, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jie","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Computer Science, University of South China, Hengyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2982246"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13061123"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-018-1351-x"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2823765"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3292247"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/7463291"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2049377"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10232888"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-023-02392-5"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.09.001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-019-01433-x"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2025068"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-021-86916-6"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2599142"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.5120560"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-023-02526-9"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-016-5616-y"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2016.11.012"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.02.044"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2018.08.001"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-016-5597-x"},{"issue":"6","key":"ref22","first-page":"2485","article-title":"A novel approach of feature extraction for analog circuit fault diagnosis based on WPD-LLE-CSA","volume":"13","author":"Wang","year":"2018","journal-title":"J. Elect. Eng. Technol."},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3024337"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-023-02524-x"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/acad1e"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2968744"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3310075"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1587\/elex.18.20210174"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2025.111840"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2025.3603570"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1063\/5.0270220"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-17419-7"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1115\/1.4031697"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2012.03.027"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.3390\/ma13102260"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-021-01842-2"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11299633.pdf?arnumber=11299633","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T18:47:18Z","timestamp":1766602038000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11299633\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3644032","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}