{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T05:04:19Z","timestamp":1768280659621,"version":"3.49.0"},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62162028"],"award-info":[{"award-number":["62162028"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2025.3650430","type":"journal-article","created":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T18:38:09Z","timestamp":1767292689000},"page":"2955-2972","source":"Crossref","is-referenced-by-count":0,"title":["WECI-YOLO: Multi-Module Enhanced Steel Surface Quality Defect Detection"],"prefix":"10.1109","volume":"14","author":[{"given":"Huixiang","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Information and Software Engineering, East China Jiaotong University, Nanchang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-3497-3048","authenticated-orcid":false,"given":"Jian","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Information and Software Engineering, East China Jiaotong University, Nanchang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tianxing","family":"Jiang","sequence":"additional","affiliation":[{"name":"School of Information and Software Engineering, East China Jiaotong University, Nanchang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2016.10.030"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2019.02.123"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/app11167657"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-023-10438-y"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.81"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2022.01.135"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.l007\/978-3-319-46448-0_2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1186\/s40537-021-00444-8"},{"key":"ref9","first-page":"15908","article-title":"Transformer in transformer","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Han"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.690"},{"key":"ref13","article-title":"YOLOv3: An incremental improvement","author":"Redmon","year":"2018","journal-title":"arXiv:1804.02767"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2004.10934"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.00721"},{"key":"ref16","article-title":"YOLOv11: An overview of the key architectural enhancements","author":"Khanam","year":"2024","journal-title":"arXiv:2410.17725"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3252021"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.62527\/jitsi.5.2.238"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2022.3158253"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3255408"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ETECTE59617.2023.10396663"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICECT61618.2024.10581350"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-72949-2_21"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01118"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.02617"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2205.12740"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2002.1017623"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1973.4309314"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1023\/b:visi.0000029664.99615.94"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2005.177"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/app8091575"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1117\/12.481097"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-04295-4_2"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/s00365-021-09548-z"},{"key":"ref36","first-page":"7694","article-title":"Understanding batch normalization","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"31","author":"Bjorck"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01553"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/2964284.2967274"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1911.08287"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/s20061562"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/computers13120336"},{"key":"ref42","first-page":"838","article-title":"Precision-recall-gain curves: PR analysis done right","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"28","author":"Flach"},{"key":"ref43","article-title":"MPDIoU: A loss for efficient and accurate bounding box regression","author":"Ma","year":"2023","journal-title":"arXiv:2307.07662"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11321132.pdf?arnumber=11321132","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,12]],"date-time":"2026-01-12T22:02:32Z","timestamp":1768255352000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11321132\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":43,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3650430","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}