{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T16:22:21Z","timestamp":1779294141811,"version":"3.51.4"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"ational Research Foundation of Korea (NRF) grant funded by the Korea government","award":["RS-2024-00405278"],"award-info":[{"award-number":["RS-2024-00405278"]}]},{"name":"Regional Innovation System & Education (RISE) program through the Jeju RISE center, funded by the Ministry of Education(MOE) and the Jeju Special Self-Governing Province, Republic of Korea","award":["2025-RISE-17-001"],"award-info":[{"award-number":["2025-RISE-17-001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3661638","type":"journal-article","created":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T20:51:07Z","timestamp":1770411067000},"page":"24650-24664","source":"Crossref","is-referenced-by-count":1,"title":["ResViT-Solar: A Hybrid Residual-Transformer for Photovoltaic Panel Fault and Cleanliness Detection"],"prefix":"10.1109","volume":"14","author":[{"given":"Nazrul","family":"Amin","sequence":"first","affiliation":[{"name":"Department of Computer Engineering, Jeju National University, Jeju-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4759-0138","authenticated-orcid":false,"given":"Yong-Woon","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Jeju National University, Jeju-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chulung","family":"Kang","sequence":"additional","affiliation":[{"name":"Department of Mechanical Systems Engineering, Jeju National University, Jeju-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1107-9941","authenticated-orcid":false,"given":"Yung-Cheol","family":"Byun","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Major of Electronic Engineering, Food Tech Center (FTC), Jeju National University, Jeju-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3551749"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2024.103104"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2023.112186"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2022.08.084"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112466"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3548249"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.5455\/njeas.150264"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2023.110063"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202214271"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2021.117964"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2024.171797"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-72019-5"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2024.11.033"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-024-10000-z"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2023.04.059"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2022.10.055"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12214397"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2022.03.018"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2023.102147"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2024.124230"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2024.07.044"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2021.07.070"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.32604\/csse.2023.028898"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.imu.2022.100916"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijcce.2021.02.002"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/app15042088"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01625"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.compbiomed.2023.107133"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.18280\/ts.400216"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1186\/s12859-023-05293-1"},{"key":"ref31","article-title":"An image is worth 16\u00d716 words: Transformers for image recognition at scale","author":"Dosovitskiy","year":"2020","journal-title":"arXiv:2010.11929"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3152247"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.01733"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/s11633-024-1393-8"},{"key":"ref36","article-title":"Recent advances in vision transformer: A survey and outlook of recent work","author":"Islam","year":"2022","journal-title":"arXiv:2203.01536"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2022.3218783"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2022.103501"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3389\/fphar.2022.929755"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01386"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/app13095521"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.seta.2022.102110"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11373031.pdf?arnumber=11373031","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,23]],"date-time":"2026-02-23T20:49:10Z","timestamp":1771879750000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11373031\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3661638","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}