{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,11]],"date-time":"2026-06-11T14:42:53Z","timestamp":1781188973872,"version":"3.54.1"},"reference-count":99,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Fuzhou Science and Technology Bureau through the \u201cJie Bang Gua Shuai\u201d project initiative and APC","award":["FZKJ202409ZB04"],"award-info":[{"award-number":["FZKJ202409ZB04"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/access.2026.3662474","type":"journal-article","created":{"date-parts":[[2026,2,9]],"date-time":"2026-02-09T21:07:42Z","timestamp":1770671262000},"page":"22851-22869","source":"Crossref","is-referenced-by-count":1,"title":["Flexible Inspection of Defects in Liquid Crystal Display Panels: A Review"],"prefix":"10.1109","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-2697-1699","authenticated-orcid":false,"given":"Jing","family":"Huang","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Wuhan Institute of Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-9050-1137","authenticated-orcid":false,"given":"Sheng","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Wuhan Institute of Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaoyue","family":"Chen","sequence":"additional","affiliation":[{"name":"Nancheng County Institute of Machine Vision Industry Technology, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qian","family":"Cao","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Wuhan Institute of Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yadong","family":"Wu","sequence":"additional","affiliation":[{"name":"Nancheng County Institute of Machine Vision Industry Technology, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Research on the application of lean improvement model in liquid crystal panel production line","author":"Jiang","year":"2011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0923-4748(92)90007-r"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/icpr.1996.547307"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.11834\/jig.230518"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.37188\/cjlcd.2024-0235"},{"key":"ref6","volume-title":"TFT-LCD Technology: Structure, Principles and Manufacturing Technology","author":"Shen","year":"2012"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1117\/12.301232"},{"key":"ref8","volume-title":"Ergonomic Requirements for Work With Visual Displays Based on Flat Panels-part 2: Ergonomic Requirements for Flat Panel Displays","year":"2009"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/1\/015507"},{"key":"ref10","volume-title":"Definition of Measurement Index (SEMI) for Luminance Mura in FPD Image Quality Inspection","year":"2002"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3901\/jme.2010.12.013"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12132965"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.2982250"},{"issue":"24","key":"ref14","first-page":"1","article-title":"A new shape registration method in LCD display defect detection equipment","volume":"20","author":"Ye","year":"2012","journal-title":"Electron. Des. Eng."},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-020-10481-9"},{"issue":"16","key":"ref16","first-page":"98","article-title":"Research on defect detection method of dot-matrix LCD based on morphology","volume":"41","author":"Jiang","year":"2018","journal-title":"Electron. Meas. Technol."},{"key":"ref17","article-title":"Research and application of LCD defect detection technology based on machine vision","author":"Tan","year":"2023"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.7471\/ikeee.2014.18.2.234"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-017-0128-y"},{"issue":"9","key":"ref20","first-page":"111","article-title":"Research on character detection method of LCD screen based on machine vision","volume":"12","author":"Zhang","year":"2022","journal-title":"Mod. Ind. Econ. Informat."},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1117\/12.2217642"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-019-00927-1"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tsm.2022.3216289"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-023-02110-7"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-023-10438-y"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/jsid.1185"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/jsid.1171"},{"issue":"15","key":"ref28","first-page":"70","article-title":"Surface defect detection algorithm for LCD screen based on improved YOLOv10","volume":"48","author":"Yang","year":"2025","journal-title":"Electron. Meas. Technol."},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-024-19482-4"},{"key":"ref30","article-title":"Research on image recognition algorithm of LCD Mura defects based on deep learning","author":"Mei","year":"2017"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3788\/aos201535.1012001"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-021-01800-4"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109109"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/itoec57671.2023.10292039"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1364\/oe.557575"},{"key":"ref36","article-title":"Research on defect detection technology of new display screen based on deep learning","author":"Guo","year":"2021"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/3588432.3591538"},{"key":"ref38","article-title":"Research on detection and tracking algorithms for weak and small targets in image sequences","author":"Fan","year":"2019"},{"issue":"2","key":"ref39","first-page":"422","article-title":"A survey of meta-learning","volume":"44","author":"Li","year":"2021","journal-title":"Chin. J. Comput."},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/b978-0-32-399851-2.00010-7"},{"key":"ref41","article-title":"Prototypical networks for few-shot learning","author":"Snell","year":"2017","journal-title":"arXiv:1703.05175"},{"key":"ref42","doi-asserted-by":"crossref","DOI":"10.1016\/j.eswa.2023.122173","article-title":"SSL-ProtoNet: Self-supervised learning prototypical networks for few-shot learning","volume":"238","author":"Lim","year":"2024","journal-title":"Expert Syst. Appl."},{"key":"ref43","first-page":"3637","article-title":"Matching networks for one shot learning","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"29","author":"Vinyals"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2025.113477"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-022-02001-3"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1115\/1.4056219"},{"key":"ref47","first-page":"1126","article-title":"Model-agnostic meta-learning for fast adaptation of deep networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Finn"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-92805-5_28"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1007\/s40747-023-01219-9"},{"key":"ref50","article-title":"How to train your MAML","author":"Antoniou","year":"2018","journal-title":"arXiv:1810.09502"},{"key":"ref51","article-title":"Research on LCD defect classification method based on few-shot learning","author":"Li","year":"2022"},{"issue":"1","key":"ref52","first-page":"78","article-title":"LCD defect detection method based on transfer learning and improved mask R-CNN","volume":"30","author":"Wang","year":"2024","journal-title":"J. Anqing Norm. Univ. (Nat. Sci. Ed.)"},{"issue":"3","key":"ref53","first-page":"560","article-title":"Automatic defect detection method for LCD products based on few-shot learning","volume":"15","author":"Ma","year":"2020","journal-title":"CAAI Trans. Intell. Syst."},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/tsm.2017.2777499"},{"key":"ref55","article-title":"Development and application of an intelligent TFT-LCD defect recognition system based on transfer learning","author":"Jiang","year":"2024"},{"issue":"2","key":"ref56","first-page":"3","article-title":"Zero-data learning of new tasks","volume-title":"Proc. AAAI Conf. Artif. Intell.","volume":"1","author":"Larochelle"},{"key":"ref57","article-title":"CIZSL++: Creativity inspired generative zero-shot learning","author":"Elhoseiny","year":"2021","journal-title":"arXiv:2101.00173"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2013.140"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.3788\/aos201939.0828002"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.474"},{"issue":"9","key":"ref61","first-page":"7","article-title":"A survey of zero-shot image classification methods","volume":"31","author":"Yan","year":"2023","journal-title":"J. Beijing Inst. Graph. Commun."},{"key":"ref62","article-title":"Learning transferable visual models from natural language supervision","author":"Radford","year":"2021","journal-title":"arXiv:2103.00020"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-72761-0_4"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2025.117443"},{"key":"ref65","first-page":"1","article-title":"Spatial semantic-guided zero-shot defect detection method","author":"Song","year":"2024","journal-title":"Comput. Integr. Manuf. Syst."},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/smc.2014.6974493"},{"issue":"12","key":"ref67","first-page":"189","article-title":"Zero-shot learning method based on semantic space information mapping enhancement","volume":"37","author":"Zhai","year":"2020","journal-title":"Comput. Appl. Softw."},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-020-05322-7"},{"key":"ref69","article-title":"Conditional generative adversarial nets","author":"Mirza","year":"2014","journal-title":"arXiv:1411.1784"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2022.3208525"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1312.6114"},{"issue":"3","key":"ref72","first-page":"542","article-title":"Zero-shot image classification method combining VAE and StackGAN","volume":"17","author":"Zhang","year":"2022","journal-title":"CAAI Trans. Intell. Syst."},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2020.12.127"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2022.101813"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/tase.2025.3537463"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/jas.2020.1003180"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1142\/s0219467813500113"},{"issue":"5","key":"ref78","first-page":"1","article-title":"A survey of multimodal fusion technology for deep learning","volume":"46","author":"He","year":"2020","journal-title":"Comput. Eng."},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1109\/icisce.2016.152"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/tsm.2017.2648856"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2017.04.013"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3158952"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.52783\/jes.3062"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v34i07.7000"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.37188\/cjlcd.2023-0206"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.32604\/cmc.2024.056773"},{"key":"ref87","first-page":"2672","article-title":"Generative adversarial nets","volume-title":"Proc. Adv. Neural Inf. Process. Syst. (NeurIPS)","volume":"27","author":"Goodfellow"},{"key":"ref88","article-title":"Large scale GAN training for high fidelity natural image synthesis","author":"Brock","year":"2018","journal-title":"arXiv:1809.11096"},{"key":"ref89","article-title":"Progressive growing of GANs for improved quality, stability, and variation","author":"Karras","year":"2017","journal-title":"arXiv:1710.10196"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.3390\/sym17060833"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12245037"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.37188\/yjyxs20203512.1270"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1109\/tsm.2020.3048631"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1109\/tsm.2024.3448359"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1016\/j.displa.2024.102913"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.3390\/coatings13122015"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1109\/tcsvt.2023.3326279"},{"key":"ref98","article-title":"OpenworldAUC: Towards unified evaluation and optimization for open-world prompt tuning","author":"Hua","year":"2025","journal-title":"arXiv:2505.05180"},{"issue":"4","key":"ref99","first-page":"581","article-title":"A survey of embodied intelligence for flexible manufacturing","volume":"47","author":"Xu","year":"2025","journal-title":"Robot"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/11323511\/11381578.pdf?arnumber=11381578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T20:59:44Z","timestamp":1771534784000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11381578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":99,"URL":"https:\/\/doi.org\/10.1109\/access.2026.3662474","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}